X – RAY DIFFRACTION LABORATORY AT THE CENTRO DE FISICA APLICADA Y TECNOLOGIA AVANZADA, UNIVERSIDAD NACIONAL AUTONOMA DE MEXICO. (ISO 9001:2008 CERTIFIED) E. M. Rivera-Muñoz1, B. Millán-Malo1 1 Laboratorio de Difracción de rayos – X, Centro de Física Aplicada y Tecnología Avanzada, Universidad Nacional Autónoma de México, A.P. 1-1010 Querétaro, Qro. C.P. 76000, México. E-mail: [email protected] , [email protected] , Tel. +52 (442) 238-11-58 Abstract. The aim of the X-ray Diffraction Laboratory at the Centro de Física Aplicada y Tecnología Avanzada (Center of Applied Physics and Advanced Technology) in the Universidad Nacional Autónoma de México (UNAM) is focused on the study of the structure of many materials, such as metals, minerals, polymers, catalysts, pharmaceutical products, liquid crystals, organic materials, thin films, ceramics, semiconductors, etc., through several techniques related to X - ray Diffraction. With a unique configuration, the equipment has an ultra-fast solid state detector, which allows to implement, among others, the following techniques: phase identification and phase quantitative analysis, structural refinement, microstructural analysis (crystallite size and micro strains), residual stress, thin film analysis (reflectometry), pole figures, small angle X-ray Scattering (SAXS), textural analysis, non-environmental condition analysis (High temperature chamber that can reach 1500°C), etc. These techniques are useful for research in basic science and have great applications in different industries such as Pharmaceutical, Mining, Metal-Mechanical, Automotive, Food, Construction, Electronics, Ceramics, nanotechnology, catalysis, among others. In this poster, examples of the different configurations and applications that are being exploited in the laboratory are shown.
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