Semiconductor/IC Test Solutions

Semiconductor/IC Test Solutions
Wafer/Chip/Package
www.chromaate.com
Turnkey Test & Automation Solution Provider
Chroma ATE Inc, as a turnkey test & automation solution provider,
integrates customized solutions with Test & Measurement
Instruments, Automatic Test Systems and Manufacturing Execution
Systems. Over the years, Chroma has accumulated strong
experiences in semiconductor IC test areas. Chroma provides a wide
portfolio of semiconductor IC test solutions ranging from ATE, PXI
systems, IC handlers, and system level test solutions.
On the ATE & PXI side, the solutions cover applications in consumer
SoC (MCU, controller, audio, peripheral), power management IC
(Regulator, LDO, DC/DC, AC/DC, LED Driver), RF (FEM, Connectivity,
Mobile) and other specific applications (CIS, Light Sensors, RFID).
On the handler & automatic system side, the solutions include
thermal control, extreme device handling technologies, bare die
handling, pick and place handlers, CIS turnkey solutions, and system
level test solutions.
With the turnkey solutions, Chroma provides a best approach for
customers to bring down the cost of test while maintaining the test
quality and performance.
Turnkey Semiconductor/IC Test Solutions
Wafer Process
Wafer Sort
Double Sides Wafer
Inspection System
VLSI Test Systems
Final Test
RF Solution
Integrated Handler
Assembly & Package
Open Short Test
SoC/Analog Test Systems
Automatic System Level Test
Final Test
Handler
Hybrid Single Site
Test Handler
Miniature
IC Handler
CIS Turnkey Solution
Shipping
Automatic System Level
Test Handler
Semiconductor Automatic Test Equipment (ATE)
Chroma semiconductor ATE is specifically designed for high-throughput and high parallel test capabilities to provide the most costeffective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and
excellent reliability, it is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
Key Features
☑High Performance in a low-cost production system
SoC
☑High parallel test capability
MCU
☑Flexibility from engineering to production
PMIC
☑Powerful suite of software tools
☑Small footprint to save space in factory
Wireless
☑Adapter board to use other platform directly
CHROMA ATE
Touch
Sensor
Consumer
Devices
Mixed-Signal
Device
Embedded
Flash
SoC/Analog Test Systems
Model 3650-EX
Model 3650
Model 3650-CX
Key Features
☑50/100MHz Clock Rate
☑Maximum 1024 I/O Pins
☑32/64M Pattern Memory
☑Maximum 96 CH DPS
☑SCAN / ALPG Function
☑512 DUT Parallel Test
☑Microsoft Windows® 7 /XP OS
Key Features
☑50/100MHz Clock Rate
☑Maximum 640 I/O Pins
☑16/32M Pattern Memory
☑Maximum 32 CH DPS
☑SCAN / ALPG Function
☑32 DUT Parallel Test
☑Microsoft Windows® 7 /XP OS
Key Features
☑50/100MHz Clock Rate
☑Maximum 256 I/O Pins
☑16/32M Pattern Memory
☑Maximum 16 CH DPS
☑SCAN / ALPG Function
☑32 DUT Parallel Test
☑Microsoft Windows® 7 /XP OS
3650 Series Options
Key Features
☑PVI100 Analog Option
☑VI45 Analog Option
☑HDADDA Mixed-Signal Option
☑Mixed-Signal and RF Box (MRX)
☑Timing Interval Analyzer Option
PVI 100
VI 45
HDADDA
VLSI Test Systems
Model 3380
Model 3380-P, 3380-D
Model 3360-P, 3360-D
Key Features
☑50/100MHz Clock Rate
☑Maximum 1280 I/O Pins
☑32/64/128M Pattern Memory
☑Maximum 128 CH DPS (4 wires)
☑SCAN / ALPG Function
☑1024 DUT Parallel Test
☑Microsoft Windows® 7 OS
☑Flexible configuration
Key Features
☑50/100MHz Clock Rate
☑Maximum 576 I/O Pins (256 for 3380-D)
☑32/64/128M Pattern Memory
☑Maximum 64 CH DPS (4 wires)
☑SCAN / ALPG Function
☑512 DUT Parallel Test (256 for 3380-D)
☑Microsoft Windows® 7 OS
☑Flexible configuration
Key Features
☑50 MHz Clock Rate
☑Maximum 256 I/O Pins (64 for 3360-D)
☑8/16M Pattern Memory
☑Flexible configuration
☑SCAN / ALPG Function
☑32 DUT Parallel Test
☑Microsoft Windows® 7 /XP OS
LXPG2x1 (No Outlet)
STBUSx1
UR+I/F
PMUVIx1
Flexible Configuration
☑Support flexible slots
☑Flexible slot can insert I/O, UVI, ADDA, PXIe, and etc. versatile functions
☑3360-D : 2 slots ; 3360P : 8 slots ; 3380-P : 9 slots ; 3380 : 20 slots
☑Time/Freq Measurement unit
Flexible Slots
PXI IC Test Systems
Programmable Pin Electronics
Module Model 36010
DUT Power Supply
Model 36020
Mini ATE
Model A360101
Key Features
Key Features
Key Features
☑PXI / PXIe-Hybrid Compatible
☑PXI / PXIe-Hybrid Compatible
☑Maximum 64 I/O Pins
☑50/100MHz Clock Rate
☑+10V/-2V Voltage Range
☑8 Channels DPS
☑32M Pattern Memory
☑6 Selectable Current range
☑Universal Loadboard
☑Per-Channel PMU
☑16-Bit V Force Resolution
☑Support Labview / LabWindows
☑SCAN Function 4Chain/256M
☑18-Bit I Measurement Resolution
☑Windows® 7 /XP OS
☑Support Labview / LabWindows
☑Support Labview / LabWindows
☑Microsoft Windows® 7/XP OS
☑Microsoft Windows® 7/XP OS
Pick & Place Handler - Final Test (FT) and System Level Test (SLT)
Final Test
FT is taken to test before delivery of the product to customers. This test through test patterns to verify the functionality of the device and
measure the electrical characteristics to meet the desired specifications. The purposes of testing are listed as below.
☑To verify product design
☑To achieve high quality production
☑To control production quality
☑To acquire continue improvement in product yield
Advanced TEC Controller
Model 54100 Series
Key Features
☑Bidirectional driving with 150W (24V 8A), 300W (27V/12A),
Temp.
or 800W (40V/20A) output
800W
☑Filtered PWM output with >90% driving power efficiency
Stability
±0.01℃
25
while maintaining linear driving with current ripples<20 mA
Time
☑Temperature reading and setting range -50 to 150℃
with 0.01℃ resolution and 0.3℃ absolute accuracy
☑Short term stability (1 hour) ±0.01℃ and long term
stability ±0.05℃ with optimal PID control
TEC Modules
☑Feature true TEC large signal PID auto tune for
Chroma 54100 Series
best control performance
☑2 T-type thermal couple inputs, one for control feedback and
the other for monitor and offset, providing versatile control modes
Full Range Tri-temp Final Test Handler
TT Chart - Hot to Cold
85℃ ~ -40℃ : 400 sec. (Tc of Kit)
Model 3110
-40℃~125℃
Model 3110-FT
-40℃~125℃
Temp.
90
70
50
30
10
-10
-30
125
0
125
75 150 225 300 350 400 Sec.
* Only for 3110 thermal head
50
50
0
0
-40
℃
TT Chart - Cold to Hot
-40
-40℃ ~ 85℃ : 120 sec. (Tc of Kit)
℃
Model 3160-A
40℃~125℃
Temp.
Model 3180
Ambient~125℃
90
70
50
30
10
-10
-30
125
Ambient
125
40
℃
℃
0
75 150 225 300 350 400 Sec.
* Only for 3110 thermal head
System Level Test
In conventional IC backend process, to ensure shipment quality, most companies test packaged devices at speed with full function. However
this induces several issues :
【1】 Device shipment quality is not ensured due to the difference between ATE and real working environment
【2】 Time to market is delayed due to months-long test program development on ATE's
【3】 Test cost continually raises in contrast with reducing silicon cost.
Drivers to System Level Test
Time To Market
☑ Shipment made before ATE program ready
☑ Maximize device
☑ Availability
Wafer
Module Board
IC
Cycle Probe Test
Final Test
System Level Test
ICs
ICs
ATE
Module Boards
Wafer
Cost
☑ Lower investing cost (COO) than ATE
☑ Higher efficiency (lower unit cost)
than manual test
Probe Card
Disruptive Process Implement in Semiconductor Test
Fault Coverage
☑ Control DPPM
☑ Quality asurance
☑ Reduce personnel effort
☑ evaluating the system's compliance
☑ Test accessibility
☑ Detect inconsistencies between
SW and the hardware assemblages
Manual
Assembly &
Package
Wafer Process
Wafer Sort
ASFT
Auto. System
Function Test
Package Test
Mini Tabletop Single Site Test Handler
System Level Test Handler
Model 3111
Model 3260
Key Features
Key Features
☑IC packages: 5x5 mm to 45x45 mm
☑Reduce overkill rate by RC (re-check or retest)
☑Software configurable binning
☑Time and resources saving
☑Air damper contact
☑Yield increasing
☑Optimizes IC force balance
☑Tie-in BICT for various testers for RC
☑Maximize test socket lifetime
☑Optional PoP (Package on Package) solutions
☑Double stack protection
☑Made-to-order test procedure design
☑Continuous automated re-test
☑Unique FACT (Fault Auto Correlation Test) to reduce
☑Remote control operation
☑Real time system camera monitoring
☑Alerts to mobile device
personnel handling time
Shipping
CIS Turnkey Test Solutions
The CIS (CMOS Image Sensor) test solution is one of Chroma's
unique turnkey solutions. It provides the best UPH with best
optimized resource, which delivers the performance and quality
for functional and image tests. Chroma integrated CIS solution
provide the best COO (Cost Of Ownership) to customers.
Key Features
☑Handler Model 3270 -16 sites Parallel
☑16/16 light source(FT)/IPC
☑ATE 3380P 100MHz clock Rate
☑128 M Pattern Memory
☑192pins I/O pins
☑16 CH UVI (4 wires)
☑RMB2 switching board
☑Capture card (MIPI 1G)
Circuit Probing
Chroma ATE, Capture Card, and MIB
☑3380 Series 100 MHz ATE solutions
☑Flexible optimized configuration by MIB
(Matrix Interface Board)
☑Cost reduction 2-3 times vs traditional
MIB Board
LED Light Source
Chroma Tester
Capture Cards
full config ATE solutions
☑Up-to-date capture card solutions :
supporting MIPI CSI1/2, Multiple-lanes
Light Source
☑> 10 times longer life time than Halogen light source
☑No overheat issues
☑< 1% difference in spectrum response vs D65 spectrum
☑LED light source size expandable for 16-site above parallelism requirement
☑8 to 10 times cost reduction than Halogen light source
Light Source
Light Source
Pick and Place IC Handler
☑Reliable high speed pick & place handler,
supporting up to 16 sites
☑Handling various package types, with
outer dimensions 2x2mm to 14x14mm
☑Integrated FT light source for each site
☑Support low temp (-40℃) in quad sites
by Model 3110-FT
Tri-temp Test Handler
Model 3110-FT
Miniature IC Handler
Model 3270
HEADQUARTERS
CHROMA ATE INC.
66 Huaya 1st Road, Guishan, Taoyuan 33383, Taiwan
T +886-3-327-9999
F +886-3-327-8898
[email protected]
www.chromaate.com
CHINA
CHROMA ELECTRONICS (SHENZHEN) CO., LTD.
8F, No.4, Nanyou Tian An Industrial Estate,
Shenzhen, China PC: 518052
T +86-755-2664-4598
F +86-755-2641-9620
www.chroma.com.cn
JAPAN
CHROMA JAPAN CORP.
472 Nippa-cho, Kouhoku-ku, Yokohama-shi,
Kanagawa, 223-0057 Japan
T +81-45-542-1118
F +81-45-542-1080
[email protected]
www.chroma.co.jp
U.S.A.
CHROMA ATE INC. (U.S.A.)
7 Chrysler Irvine, CA 92618
T +1-949-421-0355
F +1-949-421-0353
Toll Free +1-800-478-2026
[email protected]
www.chromaus.com
SANTA CLARA
3350 Scott Blvd., #601 Santa Clara, CA 95054
T +1-408-969-9998
F +1-408-969-0375
EUROPE
CHROMA ATE EUROPE B.V.
Morsestraat 32, 6716 AH Ede, The Netherlands
T +31-318-648282
F +31-318-648288
[email protected]
www.chromaeu.com
© 2015 Chroma ATE Inc. All Rights Reserved.
201501-1000

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