FEI XL30 SEM SOP

FEI Sirion XL30 SEM
Standard Operating Procedure
v.0814
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XL30 Operating Procedure
Table of Contents
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
13.
14.
Enable SEM
Load Sample (2)
SEM Imaging Parameters
SEM Detectors
Stage Map
Start High Tension
Calibrate Stage Height
Raise Stage to +10mm
Recalibrate Stage Height
Lens Alignment
Correct Astigmatism
Acquire Micrograph
Export Micrographs
Acquire Extra-High Definition
15. Filters
16. Shutdown
17. Default Settings
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Enable SEM
• Use the support PC and login to the NTUF Coral Server.
“Enable” the SEM. This will remove the Clear Lock password
screen and allow you use the SEM.
• XL Microscope Control program should be running on the
right monitor.
• Scandium image analysis software should be running on the
left monitor.
WARNING: Never touch the main power buttons on the
front panel of the Sirion table.
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Load Sample
Sample Mounting:
The maximum mounted-sample size is 50x50x20mm (LxWxH). Clean
any organic residues from the sample with alcohol, remove lose debris with
compressed air, and handle samples with tweezers and gloves to keep them
clean.
1. Select “Vent” in the Vacuum menu.
2. Insert sample stub and tighten using set screw (finger tight).
3. Set the Height Marker on the stage base and check that there is at least
5mm of clearance between the sample and probe lens.
4. The stage switch should be set to “A” for imaging or EDS.
5. Watch the clearance on the CCD monitor as you close the chamber door.
6. Hold the door closed and select “Pump” in the Vacuum menu.
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Load Sample
If ‘Microscope Problem: Sample Touch Alarm’ appears while loading
samples, it is generally a false alarm.
1. Check the clearance on the CCD to verify there is no contact with
the roof of the chamber.
2. If it is clear that there is no contact with the sample, click “OK”
and continue.
3. If there could be contact, do not attempt to move or remove your
sample – get staff assistance.
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SEM Imaging Parameters
Z Position
Beam tab
SEM imaging should be done between +5 and +10mm of absolute
clearance.
Beam Accelerating Voltage
5 kV is the default and works for the widest variety of samples.
Lower voltage gives better surface sensitivity to images.
Higher voltages can penetrate passivation layers to reach conductive
layers below.
Spot Size
Correlates to beam current (scale 1-7, where 1 is the smallest current).
Spot 3 is the default and generally gives good signal/noise ratio.
Nonconductive samples will charge less at Spot 2.
Image brightness will improve with higher currents, but resolution is
lower.
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SEM Detectors
Detector
The default (search) mode uses an Everhart-Thornley detector to
collect secondary electrons (SEs).
The through-lens detector (TLD) is most effective in either UltraHigh Resolution (UHR) mode or in Backscatter mode.
UHR Mode
UHR mode is not safe for magnetic samples and must
not be used with the EDS detector inserted
• The exact magnification required will depend on
your current forward working distance.
• When Mag and WD conditions are met, the UHR
icon (at right) will no longer be grayed-out.
• Many detector options are available on the TLD.
Access them through the Detector Tab -> Change.
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Stage Map
Minimize/Maximize Stage menu
1. Locate the stage reference map in the
maximized “Stage” menu.
2. Double click the map to move sample(s) into
position for viewing. The beam location is
marked with an “x”.
3. Wait for vacuum status message to read
“Vacuum OK.”
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Start High Tension
1. Start the High Tension (HT) from “Beam”
menu by clicking the ‘kV’ button.
“Microscope Confirm Focus” will appear
DO NOT CLOSE THIS BOX
2. Auto adjust brightness and contrast (F9).
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Calibrate Stage Height
1. Move to the tallest part of the sample using a stage movement tool.
Get Mode – left double-click
Track Mode – left click and hold between rings
2. Use ‘+’ and ‘ –’ buttons on number pad to increase/decrease
magnification respectively.
3. Click and hold the right mouse button then focus side-to-side on the
tallest part of the sample.
4. With magnification ≥ 2000X and sample in focus click “OK.”
•
Working Distance (WD) will
update the Stage Height (Z).
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Raise Stage to +10mm
While stage is moving up or down: cover the Cancel
button in the Stage Movement window (upper left
corner of the Microscope Control program.)
1. In the “Stage” menu select Z = 10 mm and click “Goto.”
2. Watch the CCD monitor and “Cancel” the
stage move if the sample gets too close to
the probe lens.
Probe Lens
3. Refocus the sample at this new stage
height with magnification ≥ 2000X.
4. Click Z<=>FWD in the “Stage” menu to
reopen the Microscope Confirm Focus box.
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Recalibrate Stage Height
1. With the sample in focus click
“OK” to update the stage height.
2. Select the final Z ( 5 mm) and
click “Goto,” raising your sample
up to the final WD.
3. Move to the area of interest
using the stage movement tool.
Final Z-Height
Micro-scale Features Z  7.5 mm
Tilted Samples Z = 7.5 mm
E-Beam Lithography = 6.5 mm
Nano-scale Features Z = 5 mm
X-ray Analysis Z = 5 mm
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Lens Alignment (optional)
1. Change Scan rate to ‘TV.’
2. Increase magnification to ≥ 10,000X.
3. From “Beam” menu activate the “Lens
Modulator” by checking the box.
4. In the “Lens Align.” window, left-click and
hold to start the adjustment.
5. Move left-right to correct for X image
wobble or up-down to correct Y.
• Final image should appear stationary under
the white crosshairs. The image will only
oscillate in/out of focus.
6. Uncheck Lens Modulator when done.
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Correct Astigmatism
1. Obtain the best possible focus on image. (See examples below)
•
Image should not exhibit streaking or distortion before adjusting
stigmation.
2. Hold down “Shift” key and right mouse button to start the adjustment.
3. Drag green cross in X & Y until image resolution is well defined.
4. Refocus image using right mouse button.
Incorrect focus and astigmatism.
Correct focus before stigmation
adjustment.
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Acquire Micrograph
Standard Definition F2 Capture
(single frame: 720 x 968 pixels ~ 300 kb)
1. Push “F2” key to grab an image and
wait for the scan to finish.
2. Do not proceed until the snowflake
icon turns yellow.
3. Select your folder in the Scandium
database.
4. Click camera icon to transfer image
to Database ‘Scandium.’
5. Unfreeze image with ‘snowflake’
button to return to live imaging.
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Export Micrographs to Coral
1. Highlight the thumbnails to transfer in
Scandium.
2. Click
to export images as TIFs.
3. Browse “My Computer” and select Coral
drive (M:) or (Q:) as the destination.
Browse
4. Click “OK” to transfer images.
• Files will be saved for 2 weeks on the M:
drive and then automatically deleted.
Remember: Download all of
your files from M: before
the 2 week deadline.
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Acquire Extra-High Definition
Extra-High Definition F5 Capture
(single frame: 968 x 1404 pixels ~ 1.2 Mb)
1. From “Image” menu in Scandium, select
“Configure Input.”
2. Select “Input” tab to define Acquisition
mode.
Standard High Definition = F2
Extra High Definition = F5
3. In Microscope Control XL push the “F5” key
to grab an image.
4. The file is saved as LAST.TIF on the C: drive.
5. Drag-and-drop to M: and rename each image
as you collect it.
Always reset Input to Standard/High
Definition when you are done.
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Filters
If the single scan electron image looks flat or shows other signs
of charging, you may be able to eliminate these artifacts by
Integrating TV scans.
1. From the Filter Tab choose “Integrate XX Frames.”
• The image will start black and build as frames are added.
2. Wait for the Snowflake icon to light.
3. Click camera icon to transfer image to
Database ‘Scandium.’
4. Unfreeze image with ‘snowflake’ button to
return to live imaging.
• You can change the number of frames
integrated from the Filter Tab > Setup
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Shutdown
1. In Beam Submenu click “kV” to close the column
valve and ramp down HT.
2. In the Stage submenu type in Z=30 mm and click
“Goto.”
3. Message ‘Exceeds stage range.’ Click “Yes” to move stage to lowest
possible position.
4. Wait for the stage to lower completely, then select “Vent” in Vacuum
menu.
5. Reset Beam to 5kV, spot 2 or 3.
6. Reset any other changes you made to default settings (next page).
7. Wait for specimen chamber to reach atmospheric pressure
(approximately 2 minute).
8. Open the chamber, loosen set screw, and remove samples.
9. Close the chamber door and select “Pump” in Vacuum menu.
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Default Settings
SOFTWARE
Scandium
Microscope Control
• Magn > Reference (Videoprint)
• Beam > 5kV
Spot Size 2
• Scan >
Full frame
• Scan Presets > Slow 1: 1.7ms, 484 lines
Slow 2: 6.7ms, 484 lines
Slow 3: 16.5 ms, 484 lines
Slow 4: 33.2ms, 484 lines
Single: 33.2ms, 968 lines
XHD: 66.4ms, 1420 lines
• Filter (TV) > Average 8 frames & Standard def.
• Filter (Slow Scans) > Live, Standard def.
• Stage >  Stage Current
 Auto beam shift zero
Setup > Image > Configure Input >
 Standard High Def.
HARDWARE
• Stage Switch: “A” (Alarm)
• External Beam Blanker: Off
• A/B Switch Box: A (EDS)
• Belkin KVM Switch: EDS
• CCD Camera Toggle: On
• External (CCD) Monitor: On
• EDS detector: Retracted
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