Class A CMOS Current Conveyors

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Class A CMOS Current Conveyors
Watanabe, Kenzo; Cha, Hyeong-Woo; Ogawa, Satomi
IEICE Transactions on Fundamentals of Electronics,
Communications and Computer Sciences. E81A(6), p. 11641167
1998-06-25
http://hdl.handle.net/10297/3442
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IEICETRANS.FUNDAMENTALS,VOLE81−A,NO・6JUNE1998
1164
LETTER SpeciaI SecIfonofPaperざSe庇kd加mJm・CSCC’97
CIassACMOSCurrentConveyors
Hyeong・WooCHA††SatomiOGAWA†,andKenzoWATANABE†,MembeTT
SUMMARY Thesecond−generationCMOScurrentconveyors
aredevelopedforhigh−frequencyanalogslgnalprocesslng・Itconsists
ofasourcefollowerforthevoltagelnPutandaregulatedcurrentmir−
rorbrthecurrentlnPutandoutput・ThevoltageandcurrentlnputStageS
arealsocoupledbyacurrentmirrortoreducetheimpedanceofthe
currentlnputPOrt・Simulationsshowthatthisarchitectureprovidesthe
bythenegativefeedback,butthebandwidthisstillcompa−
rabletothatofanop−amp・Thiscomparisonofkeyperfor一
mancefeaturesimpliesthatanidealCCIIcouldberealized
byapplyingthenegativefeedbacktothepush−pullarchitec−
ture.Basedonthisidea,aneWarChitectureofCCIIisdeve1−
highinput/Outputconductanceratioandtheinherentvoltageandcur−
opedl20].ComparedtotherecentlyproposedCCIIwhich
renttransferbandwidthsextendingbeyondlOOMHz・Theprototype
usesacascodestagetokeepthepotentialatthecurrentlnput
chipsfabricatedusingO・6pmCMOSprocesshaveconnrmedthesimu−
1atedperR)rmanCeS,thoughthevoltageandcurrentbandwidtharelim−
itedto20MHzand35MHz,reSpeCtively,bythebuilt−incapacitances
nodeconstant【21],thisarchitectureusesthefeedbackstage
l.Introduction
whichconsistsofasimplecurrentmirror・Theoperationof
thefeedbackstageisindependentofthebiascurrentandthus
itisapplicabletoclassABCCIIs・InthefollowlngS,itscir−
cuitconfiguration,SimulatedandmeasuredperformanCeSOf
theprototypechipsfabricateduslngO・6pmCMOSprocess
willbedescribed.
Acurrent−mOdeapproachisqulteattraCtivetohigh−frequency
2.CircuitDescription
Ofthebondingpads・
恒…川か.・川′・′川卜川り‘/川.岬//り…血糊。∫lJり・ゝMJ‘●.叩JHJ(、わ=址
(Ⅵr/で〃Jco/ZVり’Or
slgnalprocesslng,becauseitcanberelievedofthegain−band−
WidthlimitationaccompanylngWiththevoltage−mOdeslg−
nalprocesslng・Aversatilebuildingblockforcurrent−mOde
slgnalprocesslnglnthecontinuoustime−domainisthecur−
rentconveyor[1日2].rIbwarditsmonolithicimplementa−
FigurelshowsthecircuitdiagramoftheCMOScurrentcon−
veyor・TransistorM2,M3・M4,andM6formtheregulatedcur−
rentce11forthecurrentlnPutandMlformsthesourcefo1−
lowerfbrthevoltagelnput・M3,M5,andM7formthecascode
tion,manyarChitecturesofthesecond−generationcurrent
currentmirrortotransferthecurrentiflowlnglntOthenode
conveyors(CCIIs)basedonop−amPSfollowedbycurrent
XtothenodeZ・AssumefbrthemomentthatM3,M4,andM5
mirrorshavebeenproposedintheearlystageofdevelop−
andtwocurrentsourcesJarematChed.Then,
ment【3].Theseevolutionaryarchitecturesandtheirapplica−
tionshavehappilyprovedthatanyfunctioneverperformed
J_=上.r. (1)
inthevoltagedomainispossiblewiththecurrenトmodeap−
ThesameamountofthecurrentalsoflowthroughMl・There−
proachl4],buttheirperformanceshavefailedtosurpasstheir
fore,thefollowlngrelationholds・
voltage−mOdecounterpartsl5日7]・
Current−mOdeprocesslngftaturesinherentwideband−
widthcapability・Tbfullyeruoythisadvantage,theinnova−
tivearchitectureofCCIIhasbeenexploitedandmanyarchi−
tectureswhichdonotinvoIveop−ampShavebeenreported・
Thoughdifferentindetails,theirlnPutStageSCanbeclassi−
fiedintotwobasicarchitectures;Onebasedonthepush−pull
gml(V、、一再=g証−VJンVダム.、, (2)
wheregm,(i=1,2)isthetransconductanceofMi,Vsisthe
sourcepotentialofMl,andRistheloadresistorconnected
tothenodeX.From(2),Wehave
stagederivedfromtheWilsoncurrentmirror【8]−[14]and
theotheronthedifferentialstagel15日19]・Intheformer
configuration,thewidebandvoltageandcurrenttransferchaト
acteristicsareaChievable,butthefiniteimpedanceatthecur−
rentlnPutPOrtinvalidatesthevirtualgroundconcept・Inthe
latterconfiguration,Ontheotherhand,theimpedanceatthe
currentlnPutpOrtCanbereducedtoanegligiblysmallvalue
ManuscrlptreCeivedOctoberl,1997・
ManuscrlPtreVisedDecember26,1997・
†TheauthorsarewiththeResearchInstituteofElectronics,
ShizuokaUniverslty,Hamamatsu−Shi,432−8011Japan・
Fig・1ThecircuitdiagramofCCII+・
LETTER
V =
g研lg′〃2凡V、,
■r gml一g川2+g′扇乳〃2年で
(3)
Ifgm.=gm2,Orgm.gm2年r》g”,.て〝,,Whichisreasonableinprac−
④,reSPeCtively・AmicrophotographoftheCCII+issh。Wn
inFig・3・AllPMOStransistorscanbeseenimplantedinto
then−WellintheupperpartexceptMっwhichisimplanted
independentlylntOthen−Wellinthelowercentralpart.Per−
fbrmancesoftheseprototypechipsweremeasuredunderthe
tice,thenvfollowsexactlyvY・Theoutputimpedancer=is
biascondition;㌦。=」ts=2・5V,th=−0・5V,andJ=100日A
㌔=㌦〟(g用石打㌔6), (4)
WhereristheinternalresistanceofthecurrentsourceJand
㌦i(i=5,7)isthedrain/sourceresistanceofM,・Ifthecurrent
WhichwassetbytheextemalresistorconnectedbetweenNl
andtts・Measuredperfbrmanceswerecomparedwiththose
SimulateduslngHSPICEwithleve147transistormodel.
Figure4showsthecurrent−VOltagecharacteristicsatthe
i=isnotafftctedbytheload・Nocurrentflowsthroughthe
nodeXwhennodesYandZareshort−Circuited・Theinput
impedancerrandtheoffsetvoltageatnodeXare350Qand
nodeY;iY=0・TheinputimpedancerratthenodeXisglVen
−0・43V,reSPeCtively・Thesemeasuredvaluesdifftrlargely
SOurCeJconsistsofthecascodemirror,thenr_issohighthat
by
fromthosesimulatedones,30f2and−0・33V・reSPeCtively・
Thedifferencesareattributedtoincorrectbody−effect
paramters・Introducingthediode−COnneCtedPMOS and
1 g,,河g′痛 1
r =−−
NMOStransistorsinserieswithMlandMっ,reSPeCtively,One
’rg椚2g諸道g′痛+‰ (5,
Inderiving(5),gminsi》lisassumed.Thesecondterminthe
right−hand−SidearisesfromthecascodecurrentmirrorR)rmed
byM3,M4,andM6WhichregulatesthesourcevoltageofMっ・
Withtheproperdesignoftheregulatortheinputimpedance
rrcanbemadenegligiblysmallandthenodeXisvirtually
CangreatlyreducetheoffSetvoltagel19].Figure5showsthe
CurrenttranSftrcharacteristicsbetwee中、andi_Whenthenode
Yisshort−CircuitedandthenodeZisvirtua1−grOundedbythe
Thblel TtansistordimensionsinCCIIs.
T ra n sisto r
W 叫 m )
M .
30
M ,
12 0
M l、 M 、
40
3
M b 、 M IJ
60
1.
8
M N 、 M 1日
50
1.
8
M 二言
30
1.
8
groundedwhenvY=0・
SummanZlngthecircuitoperationsdescribedabove,One
CaneXPreSStheinput−OutPutrelationsasfbllows:
V
、
・
LV
I
、
0 0 0
0 0 1
0 1 0
・㌔ V了し、
M ”
L叫m )
1.
8
1.
8
(6)
Thismatrixrepresentationindicatesthatthecircuitshownin
Fig・1istheCCII+itself・TheCCII−Canberealizedbyin−
Vertlngi−bymeansofacross−COuPledcurrentmirror.
3.Pern)rmanCeS
TheCCII+andCCII−basedonFig・lwerefabricateduslng
O・6pmCMOSprocess・Thecompletecircuitdiagramis
ShowninFig・2andtransistordimensionsarelistedinThble
l・TheterminalconnectionshowninFig・2isfbrtheCCII+.
FortheCCII−,terminals④and⑥areconnectedto③and
Fig・3 AmicrophotographofCCII+.
し
′
し
′
llT
/
\
C C lト
!
−100 −50 0 50 100
Fig・2 ThecompletecircuitdiagramofCCIIfabricatedusingO・6Hm
CMOSprocess.
ん[ト止】
Fig.4 TheinputcharacteristicsatthenodeX.
IEICETRANS・FUNDAMENTALS,VOL・E8lTA,NO.6JUNE1998
1166
TbbIe2 MeasuredperformancesofCCITs.
C lass A C C H +(
C C Jl−
)
m e Sured
UUIl+
/
■
;
■
,
ヽ
‖
l_
◆
■
1
\
CC Iト
−100 −50 0 50 100 150
/X[ト止]
Technology
0・
叫 m n−
W e11C M O S process
Supply voltage
5 V or +
2.
5 V to T2 .
5V
Pow erdissIPation
2mW (
3m W )
Im pedance atnode X
350 n
1m pedance at node Y
n
lm p
e danee at node Z
6Mn
O ffset voltage (
V、VS・
V、
)
−
0.
43 V
O ffsetcurrent(
ilVS・
i)
l・
9 PA (
1.
1ト
lA )
V oltage dynam ic range
−
0.
5 V to +1.
5V
C urrent dynam ic range
−
100 ト
IA to +150 いA
3−
d B cutoff frequency of (
V/V)
2n M H z
W hen R \
=1O kO 3−
dB eutoff frequency of (
V,
/
vl・
)
18 M H z
W hen R ヽ
=
′
R =10 kf2 Fig.5 Thei_VS.iLCharacteristics.
冨P︺ u橋口
0 5 0 5 0 5
2 1 1 −
l
l
3−
dB cutofffrequency of(
jZ/
jJ
35 M H z
A ctive chip area
0.
2 ×0.
2【
mmコ
】
)
l
CCII+.Themeasuredbandwidthis35MHzwhereasthesimu_
嘉
†
J
u
inthefrequencyresponsebetweensimulationsandmeasure−
全
l
=
r
y
l
l
」
mentsinFigs・6and7areattributedtotheparasiticpoles
ヽ
l
1
Createdbythestraycapacitanceofthebondingpadswhichis
nottakenintothesimulation・Thepadcapacitanceisesti−
l
ヽ
ヽ
ヽ
1
\
R
latedbandwidthextendsbeyond300MHz.Thesedifftrences
matedexperimentallytobe15pF・Figure6alsoshowsthe
frequencycharacteristicsofCCII+whenusedasavoltage
amplinerwithnodesXandZterminatedby2kf2and10kfl,
respectively.The−20dB/decaderol1−0ffcharacteristicsindi_
1.E+031.E◆041.E十051.E+061.E◆071.E+081.E+091.E◆10
Catethatthebandwidthislimitedagainbythepadcapaci−
tances・rIbconfirmtheseexperimentalobservation,thefre−
Frequency[HZ】
Fig・6 Thefrequencycharacteristicsofthevoltagetransferfunction.
quencycharacteristicsincludingthepadcapacitancesare
l
Characteristicsandalsoconfirmthatthehighfrequencypeak−
lngapPearlnglnthefrequencyresponseofthecurrenttrans−
Simulated・Theresultsareingoodagreementwithmeasured
⊥
l
1
1
− 1
5 0
︻宅]ヾ\ヾ
l
l l
†
T
rl
l
‡
\ t
l
ferfunctionisduetothepadcapacitances.Thesamefre−
quencyresponseswerealsoobservedinCCII−.
4.Conclusions
CircuitconfigurationsandperfbrmancesofCCIIsfabricated
uslngO・6HmCMOSprocessweredescribed・Measuredper−
formancesaresummarizedinTbble2・Theseperformances,
1.Eペ)31.E+041.E+051.〔+061.【+071.E+081.E+091.〔十10
especiallythebandwidth,areinsufficientforenJOylngCur−
Frequency[Hz]
rent−mOdeslgnalprocesslng・Thedominantpolewhichlim−
itsthebandwidthisformedbytheparasiticcapacitancesof
thebondingpadsandextemalresistors.Therefbre,theband−
Fig・7 Theftequencycharacteristicsofthecurrenttransfbrfunction.
Widthcanbegreatlyextendedbyloadingtheoutputnodes
Current−tO−VOltageconverteruslnganOp−amP・Agoodagree一
mentbetweenthesimulationandthemeasurementandthe
linearcurrent−fbllowlngaCtionoverthefullbiascurrentrange
Canbeseen.
Figure6showsthefrequencycharacteristicsofthevolt−
Withsmallresistors・Anotherissuefbrhigh−aCCuraCySlgnal
PrOCeSSlngisthelargeoffsetvoltage・Simulationsshowthat
theoffsetvoltagecanbegreatlyreducedbytheinputstageS
COmprisedofCMOSpalrS・Theseimprovementsarefuture
WOrkstowardanidealCCII.
agetransferfunctionofCCII+WhenthenodeXandZare
loadedby2kE2・The−3dBcutofffrequencyis20MHz・Ac−
Rettrences
COrdingtosimulationswithoutpoundingpads,theinherent
bandwidthextendsbeyondlOOMHz・Figure7showsthefre−
quencycharacteristicsofthecurrenttransferfunctionof
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