Materials Science Product Guide w w w.a x t .c o m.a u Sol ut i ons for Sci ence and Industr y SEM Products Xe Plasma FIB-SEM [FERA] • • • • World’s first fully integrated Xe plasma FIB with FEG-SEM Sputtering rates up to 50X conventional Ga source FIBs Suitable for milling large volumes of materials High ionisation rate suitable for TOF SIMS analysis Ultra-High Resolution FIB-SEM [GAIA] • • • • Excellent high resolution imaging at low voltages (10 to 50 V) Ultra-high resolution COBRA-FIB column Unique column design enables a range of imaging modes Low working distance for high resolution 3D tomography FIB-SEM [LYRA] • • • • Latest technology Ga FIB with high resolution Schottky FEG-SEM COBRA FIB, World’s most stable and easy to operate FIB column Optimised chamber permits simultaneous analytical techniques Word’s best chamber design for simultaneous 3D EDS/EBSD Ultra-High Resolution FEG-SEM [MAIA] • • • • Ultra-high resolution SEM at very low voltages Excellent analytical performance Extremely fast imaging rates up to 20ns/image Unique live stereoscopic imaging using 3D Beam Technology FEG-SEM [MIRA] • • • • Ultra-fast scanning and rapid image acquisition Excellent resolution at both high vacuum & pressure (to 500Pa) Configured with Beam Deceleration Technology (BDT) Best price to performance ratio on the market Thermionic SEM [VEGA] • • • • High resolution imaging with W and LaB6 emitter Suitable for high and variable vacuum operation Fully automated column set-up and alignment User friendly software suits novice operators Correlative Raman/SEM [RISE] • World’s first fully integrated Raman & SEM • Combines ultra-high resolution SEM imaging with fast and high resolution Raman mapping • No compromise in Raman signal collection Thermo Scientific Microanalysis EBSD [QUASOR] • Acquire EBSD, WDS and EDS spectra simultaneously • Wide range of mapping display options e.g. Euler, HKL & UVW • Phase and grain boundary maps • Texture analysis and rapid pole figure interpretation EDS [Ultradry and Compact Ultradry] • Superior resolution at incredibly high collection rates • Integrated FET eliminates almost all electronic noise • Light element sensitivity down to Be • One of the greatest solid angle of collection available for detectors on the market WDS [MagnaRay] • Unparalleled microanalysis results • Automatically handles alignment, analysis settings & acquisition • High sensitivity for trace elements • Continuous spectrometer coverage for full spectral range Materials Science Product Guide X-Ray Diffraction Micro XRD Rigaku RAPID II Arguably the most versatile x-ray area detector in the history of materials analysis, the RAPID II exploits the benefits of imaging plate technology that maximises simultaneous diffraction accumulation and minimises measurement time. Applications include microdiffraction mapping down to 10µm, phase ID of powder samples, diffuse scattering, fibre diffraction, small molecule structure analysis, stress and texture measurements, etc. Crystallography SmartLAB 3 XRD S-MAX 3000 SAXS • • • • • • • • Fully computer-controlled/automated alignment Expert analysis of thin films, nanomaterials, powders etc In-plane measurements possible without reconfiguration Focusing and parallel beam optics without reconfiguration Suitable for ani/isotropic scattering samples 3 pinhole collimation with conventional/high brilliance XRG Extended q-range with 2nd sample chamber and IP detector Custom scripting language for automated data collection Miniflex • Most powerful benchtop XRD = faster analysis • D/tex detector delivers superior sensitivity • Factory aligned goniometer XRD • Compatible with auto sample changer XRD XtaLAB mini • • • • Automated 3D chemical structure determination SHINE optic generates data equivalent to larger systems Excellent data quality, exceeds IUCr publication standards Intuitive software interface X-Ray Fluorescence ZSX Primus WDXRF Simultix 14 WDXRF diffractometers addresses a wide range • • • • MOFs, to biological macromolecules. They Supermini200 WDXRF • • • • Rigaku XtaLAB PRO series The XtaLAB PRO series of single crystal of sample types, from small molecules to incorporate HPAD detectors (Hybrid Pixel Measures Be to U with minimal standards Exceptional light element (low Z) detection limits Mapping feature for elemental topography/distribution Micro analysis to analyse samples as small as 500μm Compact design and reduced footprint Multi-channel design produces speedy results Suited to production environments Highly reliable proven technology You can tailor the instrument to your • • • • sources from 3kW sealed tube, to FR-X NEX CG Array Detectors) which provide shutterless data collection at exceptional speeds. requirements with a selection of x-ray Superbright, to dual wavelength. Add the kappa goniometer, ergonomic enclosure and cryo-devices and you have an incredibly powerful system for structure determination. • • • • World’s premier benchtop WDXRF system Analyse oxygen through uranium (O to U) Easy analysis of low concentration levels of light elements Lower detection limits and shorter measurement times EDXRF Suited to solids, liquids, powders & thin films Analyse sodium to uranium (Na to U) non-destructively Polarised excitation for lower detection limits ppb detection limits for aqueous samples using UltraCarry Manipulators XPS Kleindiek Nanotechnik Thermo Scientific X-Ray Photoelectron Spectrometers (XPS) • • • • • Unparalleled ease-of-use Best-in-class software High sample throughput with superior results Suited to production or analytical laboratories Available in XPS, XPS Microprobe and Angle Resolved XPS (ARXPS) models X-Ray CT Rigaku nano3DX • True x-ray microscope • Measures relatively large samples at high resolution • Impressive measurement speed • High power x-ray source with switchable anodes for optimal contrast • Single acquisition 3300x3300x2500 voxels with 0.6µm resolution • Probestations for electrical characterisation • Nanoworkstations for precise manipulation • SuperFlat AFM allows in situ AFM, topographical and frictional measurements to be taken in an SEM • Lift-out Shuttle offers a simple, costeffective solution for TEM and atom probe inspection • Nanomanipulators for electron (SEM, TEM & FIB) and light microscopes 3D Microscopy Hirox Digital Zoom Microscope • Obtain high quality images and utilise multiple angles of observation to yield small but significant details. • High resolution CCD captures images 1200x1600 pixels • 24fps capture rate for real time HD video output • 360° rotary head and one-touch 3D imaging • Performs 3D measurements Raman Mapping Laser Raman Microscopes • Industry leading performance and imaging quality • High spatial resolution allows precise component distribution • High speed imaging via multichannel spectroscopy and laser scanning • Wireless connectivity for remote operation and analysis Materials Science Product Guide Sample Prep Sample Prep Spex X-Press 3635 35-ton Pellet Press The X-Press 3636 is a 35 ton automated hydraulic sample press suited to producing 13, 31, 35 and 40mm pellets. Ion Beam Preparation for repetitive pressing of samples for XRF, IR and other Fischione NanoMill® TEM Specimen Preparation System The automated and fully programmable operation is ideal analytical techniques. A safety interlock and automatic pump shut-off valve ensures operator safety. The X-Press can also be operated in manual mode under user control. Fischione’s NanoMill is an excellent tool for producing high quality thin sections for TEM imaging and analysis. It is ideally suited to post-FIB processing and the enhancement of conventionally prepared specimens. Gaseous ion source technology allows the user to perform Spex Mixer Mill • High energy ball mill • Samples from 0.2 to 10grams • Ideal for dry/slurry grinding, mechanical alloying, blending & mixing Sample Prep ultra-low energy milling with ion energies as low as 50eV and beams as small as 1µm. Combined with programmable automated operation, all processing parameters can be controlled for optimal preparation of a range of samples. Ion Mills • Automated sample preparation systems • TEM Mills – Compact, precise and consistent • Milling with ultralow kV ions Tomography Holders • Wide tilt and translation ranges with rotation • Maximises field of view in the TEM • Cryo specimen holders – base temp <-170°C Katanax K2 Prime – XRF Fusion Bead Machine The K2 Prime brings the ultimate in fusion accuracy together with all the advantages of electric power for the automated production of XRF beads. Key features of the K2 Prime include allowing the user to Contamination Solutions • Plasma Cleaners • Removal of carbonaceous debris • Vacuum storage produce XRF samples using controlled heating, energy efficiency and ease of installation combined with a safety shield to protect the operator, all controlled using a sleek industrial grade touch screen interface. The system comes with in-built recipes and can process up to 6 samples simultaneously, or 24 to 30 samples per hour. AXT PTY LTD www.axt.com.au Conventional Sample Prep • Ultrasonic disk cutters • Electropolishers • Specimen punches • XTEM prep kit • Specimen grinders • Dimpling grinders AXT Head Office - Sales and Service Unit 1 / 3 Vuko Place Warriewood NSW 2102 Australia P: E: +61 (0)2 9450 1359 [email protected]