Time-of-Flight Secondary Ion Mass Spectrometry for Zeolite Characterization By BUDIHARDJO Felicia Febriana MPhil Thesis Presentation Department of Chemical and Biomolecular Engineering As the most commonly used characterization method, the X-Ray Diffraction (XRD) has been widely used for detcting zeolites and zeolite-like material. Zeolites have been widely studied for many applications in various field such as catalysis, purification, and separation. Unfortunately, for zeolite characterization, XRD has a limitation on sensitivity. By using XRD, the zeolite structures are only detectable when the zeolite content is more than 3% of the mixture. In order to overcome this limitation, the Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) is examined in this study. With the assistance of Principal Component Analysis (PCA) for zeolite detection, the sensitivity limit of this technique is compared with ToF-SIMS. Different zeolite species ZSM-5, Sil-1, NaA, and NaX (MFI-, FAU- and LTA-type) are tested in this research as mixtures with crystallized silica. Results indicates that and the sensitivity limit of ToF-SIMS is higher than that of XRD. Date: Time: Venue: 5 September 2014 (Friday) 14:30 Room 4577 (Lift 27-28) Examination Committee: Prof. Chi Ming Chan, Chairman Prof. King Lun Yeung, Supervisor Prof. Lutao Weng ALL ARE WELCOME
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