Fallstricke präziser DC- Messungen

Fallstricke präziser DCMessungen
Sascha Egger, Applications Engineer Group Leader
National Instruments Switzerland GmbH
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Agenda
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Overview of Precision Test Systems
Techniques for:
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Low-voltage measurements
Low-resistance measurements
Low-current measurements
High-impedance measurements
Sweeps
Conclusion: Measurement Considerations
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What are Precision Measurements?
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Precision explicitly means:
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Reproducibility/repeatability
Yield same results each time measurement is taken
To man people, it also implies:
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Accuracy – the overall uncertainty of a measurement
Resolution – number of bits used by the ADC (or DAC) to
represent a signal
Sensitivity – the smallest signal detectable by a particular
instrument on its most sensitive range
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What are Precision Measurements?
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With modern instrumentation, these parameters usually
come into question for the following:
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Voltage under 10 µV
Current under 10 µA
Resistance under 10 mΩ
A precision measurement system should offer good
accuracy, resolution, sensitivity, and precision for
measurements under/of? these values.
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Precision Measurement Examples
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Dielectric absorption
Electrochemical
Leakage
Low-current
semiconductor
Light measurements
Connector testing
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Surface insulation
resistance
Resistivity
Charge measurements
Temperature
Contact resistance
Superconductor resistance
Challenges in Precision Measurements
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Cost/Specialty of measurement equipment
Environmental challenges
Test times
Cabling
Channel count
This presentation will provide a case study for building a
precision DC test system in PXI and point out some
pitfalls.
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Case Study
Precision Device Under Test (DUT)
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Reed relay – SRC devices form “a” relay
Tests to be performed:
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Contact resistance
Coil resistance
Thermal offset
Coil pickup voltage, current
Coil dropout voltage, current
Open contact resistance
Settling time
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Relay Specifications
150 mΩ
10 GΩ-1 TΩ
500 us
450-550 Ω
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3.75 V, 0.8 V
Equipment
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PXI-1042 chassis and PXI-8119 controller:
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Measurements:
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Source:
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PXI-4110 programmable DC power supply
Switch:
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PXI-4071 7 ½-digit DMM
PXI-4022 6-wire guard and current amplifier
PXI-2530 8x16 reed relay matrix
PXI-2565 16-channel SPST relays
External 100V DC-DC converter or
SMU PXI-4132
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System Architecture
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Low-Voltage Measurement Devices
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Data acquisition modules:
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X Series DAQ: 16 bits, sensitivity as low as 15 µV
Absolute accuracy as low as 291 ppm (1 V range)
Digital multimeters (DMM):
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PXI-407x FlexDMMs: 18-26 bits, sensitivity as low as 10 nV
Absolute accuracy as low as 28 ppm
(wide temperature? range, 2-year calibration, 100 mV
range)
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Calibration
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Instruments must be calibrated at regular intervals.
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Benefits of calibration:
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Reduced measurement errors
Consistency between measurements
Assurance you are making accurate measurements
Calibration procedures:
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Self-calibration
Manual calibration procedures
NI calibration services
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NI-DMM Driver
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API, examples and help will be installed with NI-DMM
driver.
Supported platforms:
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LabVIEW & LabVIEW Real-Time
LabWindows CVI & LabWindows CVI Real-Time
Microsoft Visual C++
Microsoft Visual Basic 6.0
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Soft Front Panels for Modular Instruments
DMM Soft Front Panel will be installed with NI-DMM
Driver.
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Low-Voltage Measurements
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Major concern #1: Offset voltages
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Thermal offsets develop from junction points in the system
(similar to a thermocouple).
Voltmeter or DMM input offsets
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Low-Voltage Measurements
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Major concern #2: Noise
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Johnson noise
Magnetic fields
Ground loops
Johnson noise
enr = 1.28 x10-10 * Rf
Twisted-pair wires to
reduce noise
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Thermal Offset
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Low-Resistance and
In-Circuit Measurement Devices
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Digital multimeters:
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PXI-407x FlexDMMs: 18-26 bits, sensitivity as low as 10 µΩ
Absolute accuracy as low as 60 ppm (wide temperature? range,
2-year calibration, 100 Ω range)
2-wire and 4-wire capability
In-circuit guard amplifier accessory:
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PXI-4022 6-wire guard and current amplifier: enables 6-wire
resistance measurements
±200 µV guard accuracy, typical
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Low-Resistance Measurements
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Major concern #1: Lead resistance
4-wire measurement
2-wire measurement
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Low-Resistance Measurements
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Major concern #2: Thermal EMFs
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Current reversal method
Offset-compensated ohms
VOCO = VM1 - VM2 = (ISRX + VTHERMAL) - VTHERMAL = ISRX
therefore: RX = VOCO/IS
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Contact Resistance
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Low-Level Resistance Measurements
with DMM (4-Wire Mode)
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Internal current source (1mA)
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External current source
(100mA)
Low-Level Resistance Measurements
with a DMM and Additional Current Source
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External current source
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Low-Current Measurement Devices
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Digital multimeters (shunt ammeters):
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PXI-407x FlexDMMs: 18-26 bits, sensitivity as low as 1 pA
Absolute accuracy as low as 390 ppm (2-year calibration, 1 µA
range)
Max burden voltage: <50 mV on 1 µA range, <700 mV on 3 A
range
PXI-4022 as a feedback ammeter:
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PXI-4022 current amplifier:
I-V converter used with voltmeter, sensitivity as low as 0.5 pA
Absolute accuracy as low as 7,000 ppm
Max burden voltage: <20 µV on 100 nA range
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Low-Current Measurements
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Major concern #1: Generated currents
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Offset currents – due to measurement equipment
Triboelectric effects – cable movements induce charge
Piezoelectric effects – mechanical strain induces charge
Contamination/humidity – reduce resistance
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Low-Current Measurements
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Major concern #2: Leakage currents and guarding
itest - ileakage
DUT
HI Sense
HI
itest
DMM
ileakage
+
-
Guard
LO Sense
LO
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Test Fixture
Low-Current Measurements
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Major concern #3: Burden voltage
Imeasured = (1.5 V - 0.5 V)/(5 Ω)
Imeasured = 0.2 A
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Iactual = 1.5 V/5 Ω
Iactual = 0.3 A
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High-Resistance Measurements
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Low-current measurement + high-voltage source
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PXI-4022 feedback ammeter with sensitivity to 0.5 pA
100 V power supply
100 V / 0.5 pA = 100 TΩ
Am
Rmeasured
100 V
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Insulation Resistance
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Low Level Current Measurement with a DMM
and an Additional Preamplifier
Connection diagram for using
PXI-4022 with PXI-4071 as picoammeter
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Voltage/Current Sweeps
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Necessary for device characterization:
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Key parameters:
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Example: sweep voltage to measure diode operation
Voltage/current programming resolution
Voltage/current readback resolution
Programming speed (up and down)
For our relay DUT, we measure the voltage or current
required to operate and release the contacts.
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Operate-Release Voltage-Current
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Settling Time
Settling time is the amount of time required for
the contacts to close (including bouncing).
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measure microseconds.
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Apply voltage across contacts.
Begin digitizer mode acquisition on contacts.
Apply voltage across coil.
Voltage across contacts will be shorted, so power
supply will current limit.
Amount of time to settle at limited voltage is settling
time.
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Settling Time
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Testing Scalability
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Switching/cabling considerations dominate precision
measurement scalability.
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Avoid testing the test equipment instead of the DUT.
Perform system calibrations.
Software plays a key role in productivity.
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TestStand, Switch Executive, and LabVIEW enable test system
deployment to multiple DUTs.
Maximize code reuse and performance with PXI hardware.
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Conclusion: Measurement Considerations
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When taking measurements with a DMM, consider the
following:
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Normal/Common/Effective -mode rejection ratio
(NMRR/CMRR/ECMRR)
Input resistance
Burden voltage
Thermal voltages
Settling time
Resistor self-heating
Dielectric absorption
Residual impedance
Stray admittance
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For more information…
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Digital multimeter measurement tutorial
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Modular instruments product demonstrations
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http://zone.ni.com/devzone/cda/tut/p/id/3717#toc0
Understanding instrument specifications
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http://zone.ni.com/devzone/cda/tut/p/id/3297
http://zone.ni.com/devzone/cda/tut/p/id/4439
Calibration FAQs
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http://www.ni.com/services/calibration_faq.htm#compare
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Questions?
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