XAFS ᐃ࡟ࡼࡿ a-Se ⭷ࡢ୙≀ࡢᙳ㡪ㄪᰝ XAFS Study on Effects of

http://support.spring8.or.jp/Report_JSR/PDF_IAe_ALL/IAe_10B1945.pdf
2010B1945 BL14B2
XAFS ᐃ࡟ࡼࡿ a-Se ⭷୰ࡢ୙⣧≀ࡢᙳ㡪ㄪᰝ
XAFS Study on Effects of Impurity Atoms in Amorphous Selenium Films
ྂ஭ ┿ᝅ, ᳃⏣ ㅍ, Ώ㇂ ᾈྖ, ᅵᒱ ㈗ᘯ, బ⸨ ᩄᖾ
Shingo Furui, Satoru Morita, Koji Watadani, Takahiro Doki, Toshiyuki Sato
㻔ᰴ㻕ᓥὠ〇సᡤ ᇶ┙ᢏ⾡◊✲ᡤ
Shimadzu Corporation
a-Se ࢆ⏝࠸ࡓ X ⥺᳨ฟჾ࡛Ⓨ⏕ࡍࡿᬯ㟁ὶࡢቑຍせᅉ࡟ࡘ࠸࡚㸪୙⣧≀㓟⣲ࡢᙳ㡪ࡀ␲ࢃࢀ࡚
࠸ࡿ[1]㸬ࡇࢀࡲ࡛ᵝࠎ࡞ศᯒᡭἲࢆ⏝࠸࡚ࡁࡓࡀ㸪ࡑࡢ୍➃ࢆ᫂☜࡟ࡍࡿࡇ࡜ࡀฟ᮶࡚࠸࡞࠸㸬
௒ᅇ㸪a-Se ࡢᵓ㐀ゎᯒࢆ୺࡜ࡋࡓศᯒࢆᐇ᪋ࡋ㸪ࡇࡢ୙⣧≀ࡢᏑᅾࢆᥗࡴࡇ࡜ࢆ┠ⓗ࡜ࡋࡓ㸬㟁
Ẽ≉ᛶຎ໬ࡢཎᅉ࡜࡞ࡿࢹ࣮ࢱࢆᚓࡿࡇ࡜ࡣ࡛ࡁ࡞࠿ࡗࡓࡀ㸪ᡂ⭷ࡢྛẁ㝵࡟࠾ࡅࡿヨᩱ࠿ࡽ㸪
⭷㐣⛬ࢆ᫂ࡽ࠿࡟ࡍࡿࡢ࡟ᚲせ࡞ࢹ࣮ࢱࡀᚓࡽࢀࡓ㸬
࣮࣮࢟࣡ࢻ㸸 a-Se㸪୙⣧≀㸪X ⥺᳨ฟჾ㸪ᬯ㟁ὶ
⫼ᬒ࡜◊✲┠ⓗ㸸
ᡃࠎࡣ་⒪⏝ X ⥺デ᩿⿦⨨࡟ᦚ㍕ࡍࡿ X ⥺᳨ฟჾࢆ㛤Ⓨࡋ࡚࠸ࡿ㸬᳨ฟჾࡢ X ⥺㟁Ⲵኚ᥮ᮦᩱ
࡟ࡣ㸪ධᑕ X ⥺ࢆ┤᥋㟁Ⲵ࡟ኚ᥮࡛ࡁ㸪㧗✵㛫ศゎ⬟࡛㧗⢭⣽࡞⏬ീࡀྲྀᚓ࡛ࡁࡿ a-Se ⭷ࢆ౑⏝
ࡋ࡚࠸ࡿ㸬ࡋ࠿ࡋ㸪ཌࡉ 1 mm ࡢ⭷ࢆ⵨╔࡟ࡼࡾ㛗᫬㛫࡛ᙧᡂࡍࡿࡓࡵ㸪ࡑࡢᡂ⭷㐣⛬࡟㉳ᅉࡋ
ࡓᵝࠎ࡞ၥ㢟㻔ᬯ㟁ὶࡢኚື㸪ᛂ⟅ᛶࡢ୙Ⰻ࡞࡝㻕ࡀᏑᅾࡍࡿ㸬TEM-EELS ࡟ࡼࡾ Se-K ྾཰➃ࡢㄪ
ᰝࢆヨࡳࡓࡀ㸪㟁Ꮚ⥺࡟ࡼࡿ a-Se ࡬ࡢࢲ࣓࣮ࢪࡀ኱ࡁࡃ㸪ᚤᙅ࡞ಙྕࡋ࠿᳨ฟ࡛ࡁ࡞࠿ࡗࡓ㸬௒
ᅇ㸪ၥ㢟ࡢ୍ࡘ࡛࠶ࡿᬯ㟁ὶቑຍ࡟ࡼࡿ㟁Ẽ≉ᛶຎ໬ࡢཎᅉ✲᫂ࡢࡓࡵ࡟㸪ࢲ࣓࣮ࢪࡢᑡ࡞࠸
XAFS ࡟ࡼࡿゎᯒࢆᐇ᪋ࡋ㸪⭷୰࡟ྵࡲࢀࡿ୙⣧≀㻔㓟⣲࡟╔┠㻕ࡢᙳ㡪࡟ࡘ࠸࡚ㄪᰝࡍࡿ㸬
ᐇ㦂㸸
୙⣧≀㓟⣲ࡀ a-Se ࡢᵓ㐀࡟୚࠼ࡿᙳ㡪ࢆㄪᰝࡍࡿࡓࡵ㸪௨ୗࡢ 2 ✀㢮ࡢࢧࣥࣉࣝࢆ⏝ពࡋࡓ㸬
ձ⢊ᮎࢧࣥࣉࣝ㸸ཎᩱ㉳ᅉ࡛࠶ࡿ࠿ࡢぢᴟࡵࢆࡍࡿࡓࡵ㸪≉ᛶ୙Ⰻࡢཎᩱ࡜Ⰻዲ࡛࠶ࡗࡓཎᩱࢆ
3 ࣟࢵࢺࡎࡘ⏝ពࡋࡓ㸬ࡲࡓ㸪ᐇ㝿࡟㟁Ẽ≉ᛶⰋ୙Ⰻࡢ⭷ࡑࢀࡒࢀࢆ⢊ᮎ࡟ࡋࡓࢧࣥࣉࣝࡶ⏝ព
ࡋࡓ㸬a-Se ヨᩱࡣ BN173.5 mg ࡟ᑐࡋ Se ⢊ᮎ 5.56 mg ࢆΰྜ㸪SeO2 ヨᩱࡣ BN173.5 mg ࡟ᑐࡋ SeO2
⢊ᮎ 7.82 mg ࢆΰྜࡋ㸪ࣉࣞࢫᶵ࡛࣌ࣞࢵࢺࢧࣥࣉࣝ࡜ࡋࡓ㸬
࣌ࣞࢵࢺࢧࣥࣉࣝࡣ PP ⿄࡟ᑒධࡋ㸪
ࢫࣛ࢖ࢻ࣐࢘ࣥࢺ࡟ࢭࢵࢺࡋࡓ㸬ղⷧ⭷ࢧࣥࣉࣝ㸸⭷ཌ࡟౫Ꮡࡋ࡚㟁Ẽ≉ᛶࡀ኱ࡁࡃኚ໬ࡍࡿࡇ
࡜ࡀศ࠿ࡗ࡚࠾ࡾ㸪1 mm ᡂ⭷ึᮇ࡟࠾ࡅࡿⷧ⭷㸪୰ᮇ࡟࠾ࡅࡿⷧ⭷㸪⤊ᮇ࡟࠾ࡅࡿⷧ⭷ࢆ⏝ពࡋ㸪
ᡂ⭷㐣⛬ࡢኚ໬ࢆᤊ࠼ࡿࡇ࡜ࢆヨࡳࡓ㸬ⷧ⭷ࡣ࢝ࣉࢺࣥࢩ࣮ࢺୖ࡟ᡂ⭷ࡋ㸪⭷ཌࡣ 30㹼40 μm ࡛
࠶ࡗࡓ㸬㏱㐣ἲ࡟ࡼࡿ ᐃ௨እ࡟㸪⭷⾲㠃㏆ഐࡢ᝟ሗࢆᚓࡿࡓࡵ㸪㌿᥮㟁Ꮚ཰㔞ἲࢆ⾜ࡗࡓ㸬
XAFS ᐃ᫬ࡢྛࣃ࣓࣮ࣛࢱࢆ⾲ 1 ࡟♧ࡍ㸬
⾲ 1㸬XAFS ᐃࡢྛ✀タᐃ್
ᐃࡣࢧࣥࣉ࣮ࣝ࢜ࢺࢳ࢙ࣥࢪ࣮ࣕࢆ౑⏝ࡋ㸪⮬ື࡛⾜ࡗࡓ㸬
ྛ✀ࣃ࣓࣮ࣛࢱࡣ௨ୗࡢ㏻ࡾ࡛࠶ࡿ㸬
ࣜࣥࢢ࣮ࣔࢻ
ᐃ࣮ࣔࢻ
᳨ฟ࢞ࢫ
ගᏛ⣔
11bunch train*29 㻔C-mode㻕
㏱㐣ἲཬࡧ㌿᥮㟁Ꮚ཰㔞ἲ㸪Quick Scan
N2㻔75%㻕㸩Ar㻔25%㻕㸸ධᑕഃ Ar㻔100%㻕㸸᳨ฟഃ
2 ⤖ᬗ Si㻔111㻕㠃㸪࣑࣮ࣛ3.5mrad㸪ș8.62deg
4DSlit:㸸1.0 㻔H㻕 X 5.0 㻔W㻕 mm2
ᐃ⣔
Scan start㸸9.3deg㸪end㸸8.0deg㸪step㸸㸫0.00026deg
Dwell time㸸50msec㸪total point㸸5000points㸪Theta speed㸸425pulse/sec
⤖ᯝ࠾ࡼࡧ⪃ᐹ㸸
㌿᥮㟁Ꮚ཰㔞ἲ࡛ࡣ㸪ఱࢀࡢ⤖ᯝࡶ඲࡚ྠࡌ࡜࡞ࡾ㸪ᕪࡀ඲ࡃぢฟࡏ࡞࠿ࡗࡓ㸬௨ୗ㏱㐣ἲ࡟
ࡼࡿ ᐃ⤖ᯝ࡟ࡘ࠸࡚㏙࡭ࡿ㸬
ᅗ 1 ࡟ཎᩱ⢊ᮎヨᩱ࡜㸪≉ᛶࡢⰋྰࢆุᐃࡋࡓ⭷࠿ࡽస〇ࡋࡓ⢊ᮎヨᩱࡢ Se-K ྾཰➃㏆ഐ࡟࠾
ࡅࡿ ᐃ⤖ᯝࢆ♧ࡍ㸬ࣜࣇ࢓ࣞࣥࢫ࡜ࡋ࡚ SeO2 ࢆ ᐃࡋࡓ㸬㓟⣲࡟ࡼࡿᙳ㡪ࡀᏑᅾࡍࡿሙྜ㸪
྾཰➃ࡢ࢚ࢿࣝࢠ࣮ࢩࣇࢺࡀほ ࡉࢀࡿࡇ࡜ࡀண᝿ࡉࢀࡿࡀ㸪཮᪉࡜ࡶࢩࣇࢺࡣぢࡽࢀࡎ㸪XAFS
ᐃ࡛ࡢཎᩱࣟࢵࢺཬࡧ⭷ࡢⰋྰぢᴟࡵࡣᅔ㞴࡛࠶ࡿ࡜ุ᩿ࡋࡓ㸬
୙Ⰻ⭷ 4
Normalized Absorbance䠄a.u.䠅
Normalized Absorbance 䠄a.u.䠅
୙Ⰻཎᩱ 3
୙Ⰻཎᩱ 2
୙Ⰻཎᩱ 1
Ⰻရཎᩱ 3
Ⰻရཎᩱ 2
Ⰻရཎᩱ 1
୙Ⰻ⭷ 3
୙Ⰻ⭷ 2
୙Ⰻ⭷ 1
Ⰻရ⭷ 2
Ⰻရ⭷ 1
SeO2
SeO2
12640
12645
12650
12655
12660
12640
12645
12650
Excitation Energy䠄eV䠅
12655
12660
Excitation Energy䠄eV䠅
ᅗ 1㸬ཎᩱ⢊ᮎヨᩱ࡜⭷࠿ࡽస〇ࡋࡓ⢊ᮎヨᩱࡢ XAFS ᐃ⤖ᯝ
Normalized Absorbance ȝ䠄E䠅
ᅗ 2 ࡟ᡂ⭷ึᮇ࠿ࡽ୰ᮇ㸪⤊ᮇ࡟࠾࠸࡚㸪30㹼40 μm ⛬ᗘᢳฟࡋ࡚ᡂ⭷ࡋࡓࢧࣥࣉࣝࡢ ᐃ⤖
ᯝࢆ♧ࡍ㸬㠀ᖖ࡟ᚤᑠ࡛࠶ࡿࡀ㸪ཎᩱࡸ⭷඲యࡢ⢊ᮎࡢ ᐃ᳨࡛ฟࡉࢀ࡞࠿ࡗࡓ࢚ࢿࣝࢠ࣮ࢩࣇ
ࢺࢆ᳨ฟࡍࡿࡇ࡜ࡀ࡛ࡁࡓ㸬ᡂ⭷ึᮇ࠿ࡽ୰ᮇ㸪⤊ᮇ࡟࠿ࡅ࡚㸪Se-K ྾཰➃ࡢ࢚ࢿࣝࢠ࣮ࡀᚎࠎ
࡟㧗࢚ࢿࣝࢠ࣮ഃ࡟ࢩࣇࢺࡋ࡚࠾ࡾ㸪Se ࡢ౯ᩘࡀቑຍࡍࡿ᪉ྥ㸪ࡍ࡞ࢃࡕ㓟໬ࡀᚎࠎ࡟㐍⾜ࡋ࡚
࠸ࡿࡇ࡜ࡀ␲ࢃࢀࡿ㸬ࡇࡢ⤖ᯝࡣ㸪㟁Ẽ≉ᛶࡀ⭷ཌ࡟౫Ꮡࡋ࡚ຎ໬ࡍࡿ⤖ᯝ࡜୍⮴ࡋ࡚࠾ࡾ㸪㓟
⣲ࡢᙳ㡪ࢆ␲ࡗ࡚࠸ࡿูࡢᩥ⊩[2]ෆᐜ࡜ࡶ୍⮴ࡍࡿ㸬ᅗ 2 ࡢྑᅗ࡟♧ࡉࢀࡓࡼ࠺࡟୙Ⰻ⭷࡛ࡣ୰
ᮇ࡛ࡼࡾ㧗࢚ࢿࣝࢠ࣮ഃ࡟ࢩࣇࢺࡋ࡚࠾ࡾ㸪ᡂ⭷㐣⛬࡛⭷㉁ࡀᚎࠎ࡟ኚ໬ࡋ࡚࠸ࡿ࡜⪃࠼ࡽࢀࡿ㸬
Normalized Absorbance ȝ䠄E䠅
୙Ⰻ⤊ᮇ
୙Ⰻ୰ᮇ
୙Ⰻึᮇ
Ⰻရ⤊ᮇ
Ⰻရ୰ᮇ
Ⰻရึᮇ
SeO2
SeO2
12640
12645
12650
Excitation Energy䠄eV䠅
12655
12660
Ⰻရึᮇ
Ⰻရ୰ᮇ
Ⰻရ⤊ᮇ
୙Ⰻึᮇ
୙Ⰻ୰ᮇ
୙Ⰻ⤊ᮇ
SeO2
12650
12651
12652
12653
12654
12655
Excitation Energy䠄eV䠅
ᅗ 2㸬ᡂ⭷ึᮇ㸪୰ᮇ㸪⤊ᮇᙧᡂ⭷࡟࠾ࡅࡿ XAFS ᐃ⤖ᯝ
௒ᚋࡢㄢ㢟㸸
௒ᅇࡢ ᐃ࡟ࡼࡾ㸪⢊ᮎࢧࣥࣉ࡛ࣝࡣ࡞ࡃ㸪ᡂ⭷ࡢྛẁ㝵ࢆᢳฟࡋࡓⷧ⭷ࢧࣥࣉࣝࡢศᯒࡀ᭷
ຠ࡛࠶ࡿࡇ࡜ࡀศ࠿ࡗࡓ㸬௒ᅇ☜ㄆࡉࢀࡓᡂ⭷୰ᮇࡢ࢚ࢿࣝࢠ࣮ࢩࣇࢺࡢᕪࡀ≉ᛶࡢⰋྰࢆ⌧ࡋ
࡚࠸ࡿࡢ࠿ࢆ᫂ࡽ࠿࡟ࡍࡿࡓࡵ㸪ྠᵝࡢࢧࣥࣉࣝࢆస〇ࡋ㸪෌ᗘ XAFS ᐃࢆヨࡳࡿ㸬ࡲࡓ㸪ู
ศᯒࡶά⏝ࡍࡿࡇ࡜࡛ Se-K ྾཰➃࡛ࡢ࢚ࢿࣝࢠ࣮ࢩࣇࢺࡢཎᅉࢆ᫂ࡽ࠿࡟ࡋ㸪ᡂ⭷㐣⛬ࡢ࣓࢝ࢽ
ࢬ࣒ཬࡧ୙Ⰻཎᅉࢆゎ᫂ࡋ࡚࠸ࡃணᐃ࡛࠶ࡿ㸬
ཧ⪃ᩥ⊩㸸
[1] Ọ┠ᏹ, Ricoh Technical Report NO.10, DECEMBER, 23-29, 㻔1983㻕.
[2] ௒஭┿஧, ≉㛤 2008-227036