7MBR50U2A060 1. Outline Drawing ( Unit : mm ) a LABEL ( ) shows reference dimension. 2. Equivalent circuit [ Converter ] [ Brake ] 21(P) 2(S) 3(T) 7(B) 14(Gb) 23(N) [ Thermistor ] 22(P1) 20(Gu) 1(R) [ Inverter ] 19(Eu) 13(Gx) 18(Gv) 4(U) 17(Ev) 12(Gy) 8 16(Gw) 5(V) 15(Ew) 9 6(W) 11(Gz) 10(En) 24(N1) MS6M 0799 a 3 15 H04-004-03a 3.Absolute Maximum Ratings ( at Tc= 25°C unless otherwise specified 䋩 Items Inverter Collector-Emitter voltage Gate-Emitter voltage Collector current Collector Power Dissipation Brake Collector current Converter Collector Power Dissipation Repetitive peak reverse Voltage (Diode) Repetitive peak reverse Voltage Average Output Current Surge Current (Non-Repetitive) 2 It (Non-Repetitive) Junction temperature ( except Thyristor ) Storage temperature Isolation between terminal and copper base *1 voltage between thermistor and others *2 Mounting Conditions VCES VGES Ic Icp Continuous 1ms -Ic Collector-Emitter voltage Gate-Emitter voltage Screw Torque Symbols *3 -Ic pulse Pc VCES VGES Ic Icp Pc VRRM VRRM Io Maximum Ratings Units 600 V ±20 50 100 V 50 100 187 1ms 1 device 600 ±20 Continuous 1ms 1 device 50Hz/60Hz sine wave A W V V 20 40 104 600 800 W V V 50 A A IFSM Tj=150°C, 10ms 350 A 2 half sine wave 613 As It Tj 150 Tstg Viso -40 ~ +125 AC : 1min. - 2 °C 2500 VAC 3.5 Nm (*1) All terminals should be connected together when isolation test will be done. (*2) Two thermistor terminals should be connected together, each other terminals should be connected together and shorted to base plate when isolation test will be done. (*3) Recommendable Value : 2.5~3.5 Nm (M5) MS6M 0799 a 4 15 H04-004-03a 4. Electrical characteristics ( at Tj= 25°C unless otherwise specified) Items Zero gate voltage Collector current ICES Gate-Emitter leakage current IGES Gate-Emitter threshold voltage Inverter Collector-Emitter saturation voltage Input capacitance Turn-on time Turn-off time Forward on voltage Brake Reverse recovery time Conditions min. VGE = 0V Characteristics typ. max. - 1.0 mA - - 200 nA 6.2 6.7 7.7 V - 2.25 2.45 2.55 Tj=125°C Tj= 25°C - 1.85 Cies Tj=125°C VCE=10V,VGE=0V,f=1MHz - ton Vcc = 300V tr tr (i) toff Ic = 50A VGE=±15V Rg = 68 ȍ - 2.15 3.6 0.42 - VGE(th) VCE(sat) (terminal) VCE(sat) (chip) VCE = 600V VCE = 0V VGE=±20V VCE = 20V Ic = 50mA VGE=15V Ic = 50A Tj= 25°C tf VF (terminal) VF (chip) trr ICES Gate-Emitter leakage current IGES VGE=0V IF = 50A Tj= 25°C Tj=125°C Tj= 25°C Tj=125°C IF = 50A VGE = 0V VCE = 600V VCE = 0V VGE=±20V V nF 1.20 0.60 - 0.03 1.20 0.45 - 2.00 2.05 2.35 - - 1.60 1.65 - 0.35 µs - - 1.0 mA - - 200 nA 1.85 2.15 1.70 2.00 0.45 2.15 1.20 ton Vcc = 300V Reverse current tr toff tf IRRM Ic = 20A VGE=±15V Rg = 270 ȍ VR=600V - 0.15 0.37 0.04 - 0.60 1.20 0.45 1.0 Forward on voltage VFM teminal - 1.20 1.50 chip - - Reverse current IRRM Turn-off time VCE(sat) (terminal) VGE=15V VCE(sat) (chip) Ic = 20A Resistance R B value B VGE=0V IF = 50A VR=800V Tj= 25°C Tj=125°C Tj= 25°C Tj=125°C 0.24 0.05 0.42 - - Collector-Emitter saturation voltage Units - Zero gate voltage Collector current Turn-on time Thermistor Converter Symbols - 1.10 - T = 25°C - 5000 1.0 - T =100°C 465 495 520 T = 25/50°C 3305 3375 3450 MS6M 0799 µs V V µs mA V mA ȍ K a 5 15 H04-004-03a 5. Thermal resistance characteristics Items Symbols Thermal resistance(1device) Rth(j-c) Contact Thermal resistance(1device) Rth(c-f) Characteristics Conditions Inverter IGBT Inverter FWD Brake IGBT Converter Diode with Thermal Compound (*) min. - typ. - max. 0.67 1.10 - - 1.20 0.82 - 0.05 - Units °C/W * This is the value which is defined mounting on the additional cooling fin with thermal compound. 6. Indication on module Logo of production 7MBR50U2A060 50A 600V Lot.No. Place of manufacturing (code) 7.Applicable category This specification is applied to IGBT Module named 7MBR50U2A060 . 8.Storage and transportation notes The module should be stored at a standard temperature of 5 to 35°C and humidity of 45 to 75% . Store modules in a place with few temperature changes in order to avoid condensation on the module surface. Avoid exposure to corrosive gases and dust. Avoid excessive external force on the module. Store modules with unprocessed terminals. Do not drop or otherwise shock the modules when transporting. 㨪 㨪 9. Definitions of switching time 90% 0V 0V V GE Irr VCE Ic 90% 0% 0% 㨪 㨪 0V 0A V CE Ic 90% Vcc RG 㨪 㨪 L trr 0% VCE tr(i) V GE Ic tr tf toff ton 10. Packing and Labeling Display on the packing box - Logo of production - Type name - Lot No - Products quantity in a packing box MS6M 0799 a 6 15 H04-004-03a 11. Reliability test results Reliability Test Items Test categories Test items Reference Number Acceptnorms of ance EIAJ ED-4701 sample number Test methods and conditions (Aug.-2001 edition) 1 Terminal Strength Pull force (Pull test) Test time 2 Mounting Strength Screw torque Test time : : : : 20N 10±1 sec. 2.5 ~ 3.5 N䍃m (M5) 10±1 sec. Environment Tests Mechanical Tests 3 Vibration Range of frequency : 10 ~ 500Hz Sweeping time : 15 min. Acceleration : 100m/s2 Sweeping direction : Each X,Y,Z axis Test time : 6 hr. (2hr./direction) 4 Shock Maximum acceleration : 5000m/s2 Pulse width : 1.0msec. Direction : Each X,Y,Z axis Test time : 3 times/direction 5 Solderabitlity Solder temp. : 235±5 㷄 Immersion time : 5±0.5sec. Test time : 1 time Each terminal should be Immersed in solder within 1~1.5mm from the body. 6 Resistance to Solder temp. : 260±5 㷄 Soldering Heat Immersion time : 10±1sec. Test time : 1 time Each terminal should be Immersed in solder within 1~1.5mm from the body. 1 High Temperature Storage temp. : 125±5 㷄 Storage Test duration : 1000hr. 2 Low Temperature Storage temp. : -40±5 㷄 Storage Test duration : 1000hr. 3 Temperature Storage temp. : 85±2 㷄 Humidity Relative humidity : 85±5% Storage Test duration : 1000hr. 4 Unsaturated Test temp. : 120㫧2 㷄 Pressure Cooker Atmospheric pressure : 1.7 × 105 Pa Test humidity : 85±5% Test duration : 96hr. 5 Temperature Cycle Test temp. : Low temp. -40㫧5 㷄 Test Method 401 Method㸇 Test Method 402 method㸈 5 (0:1) 5 (0:1) Test Method 403 Reference 1 Condition code B 5 (0:1) Test Method 404 Condition code B 5 (0:1) Test Method 303 Condition code A 5 (0:1) Test Method 302 Condition code A 5 (0:1) Test Method 201 5 (0:1) Test Method 202 5 (0:1) Test Method 103 Test code C 5 (0:1) Test Method 103 Test code E 5 (0:1) Test Method 105 5 (0:1) Test Method 307 method 㸇 Condition code A 5 (0:1) High temp. 125 㫧5 㷄 Dwell time Number of cycles RT 5 ~ 35 㷄 : High ~ RT ~ Low ~ RT 1hr. 0.5hr. 1hr. 0.5hr. : 100 cycles 6 Thermal Shock Test temp. : High temp. 100 +0 -5 +5 -0 㷄 Low temp. 0 㷄 Used liquid : Water with ice and boiling water Dipping time : 5 min. par each temp. Transfer time : 10 sec. Number of cycles : 10 cycles MS6M 0799 a 7 15 H04-004-03a Reliability Test Items Endurance Endurance Tests Tests Test categories Test items Reference Number Acceptnorms of ance EIAJ ED-4701 sample number Test methods and conditions (Aug.-2001 edition) 1 High temperature Test temp. Reverse Bias Bias Voltage Bias Method Test duration 2 High temperature Test temp. Bias (for gate) Bias Voltage Bias Method 3 Intermitted Operating Life (Power cycle) ( for IGBT ) Test duration ON time OFF time Test temp. Number of cycles : Ta = 125±5 㷄 (Tj 㻡 150 㷄) : VC = 0.8×VCES : Applied DC voltage to C-E VGE = 0V : 1000hr. : Ta = 125㫧5 㷄 (Tj 㻡 150 㷄) : VC = VGE = +20V or -20V : Applied DC voltage to G-E VCE = 0V : 1000hr. : 2 sec. : 18 sec. : ∆ Tj=100±5 deg Tj 㻡 150 㷄, Ta=25±5 㷄 : 15000 cycles Test Method 101 5 (0:1) Test Method 101 5 (0:1) Test Method 106 5 (0:1) Failure Criteria Item Characteristic Symbol Electrical Leakage current ICES characteristic ±IGES Gate threshold voltage VGE(th) Saturation voltage VCE(sat) Forward voltage VF Thermal IGBT ∆ VGE resistance or ∆ VCE FWD ∆ VF Isolation voltage Viso Visual Visual inspection inspection Peeling Plating and the others Failure criteria Unit Lower limit Upper limit LSL×0.8 - USL×2 USL×2 USL×1.2 USL×1.2 USL×1.2 USL×1.2 mA µA mA V V mV USL×1.2 Broken insulation mV - The visual sample Note - LSL : Lower specified limit. USL : Upper specified limit. Note : Each parameter measurement read-outs shall be made after stabilizing the components at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests. And in case of the wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry completely before the measurement. MS6M 0799 a 8 15 H04-004-03a Reliability Test Results Test categorie s Test items Mechanical Tests 1 Terminal Strength (Pull test) 2 Mounting Strength Number Reference Number of norms of test failure EIAJ ED-4701 sample (Aug.-2001 edition) sample Test Method 401 5 0 5 0 Method㸇 Test Method 402 method㸈 3 Vibration Test Method 403 5 0 4 Shock Condition code B Test Method 404 5 0 5 0 Condition code B 5 Solderabitlity Test Method 303 Environment Tests Condition code A 6 Resistance to Soldering Heat Test Method 302 5 0 1 High Temperature Storage Condition code A Test Method 201 5 0 2 Low Temperature Storage Test Method 202 5 0 3 Temperature Humidity Storage 4 Unsaturated Pressure Cooker 5 Temperature Cycle Test Method 103 5 0 5 0 Test Method 105 5 0 6 Thermal Shock Test Method 307 5 0 1 High temperature Reverse Bias Test Method 101 5 0 Test Method 101 5 0 Test Method 106 5 0 Test code C Test Method 103 Test code E method 㸇 Endurance Tests Condition code A 2 High temperature Bias ( for gate ) 3 Intermitted Operating Life (Power cycling) ( for IGBT ) MS6M 0799 a 9 15 H04-004-03a [ Inverter ] [ Inverter ] Collector current vs. Collector-Emitter voltage (typ.) Collector current vs. Collector-Emitter voltage (typ.) Tj= 25°C / chip Tj= 125°C / chip 120 120 Collector current : Ic [ A ] 15V 12V 80 10V 60 40 12V VGE=20V 15V 100 Collector current : Ic [ A ] VGE=20V 100 80 10V 60 40 20 20 8V 8V 0 0 0 1 2 3 4 0 5 Collector-Emitter voltage : VCE [V] 1 [ Inverter ] 4 5 Collector-Emitter voltage vs. Gate-Emitter voltage (typ.) VGE=15V / chip Tj=25°C / chip 10 Tj=25°C Collector - Emitter voltage : VCE [ V ] 120 Tj=125°C 100 80 60 40 20 0 8 6 4 Ic=100A Ic=50A Ic=25A 2 0 1 2 3 5 4 10 15 20 Gate - Emitter voltage : VGE [ V ] Collector-Emitter voltage : VCE [V] [ Inverter ] Capacitance vs. Collector-Emitter voltage (typ.) [ Inverter ] Dynamic Gate charge (typ.) VGE=0V, f= 1MHz, Tj= 25°C Vcc=300V䋬 Ic=50A䋬Tj= 25°C 10.00 Collector-Emitter voltage : VCE [ V ] Cies 1.00 Coes Cres 0.10 500 25 400 20 300 15 VGE 200 10 100 5 VCE 00 0.01 0 10 20 Collector-Emitter voltage : VCE [V] 25 30 [V] 0 Gate - Emitter voltage : VGE Collector current : Ic [ A ] 3 [ Inverter ] Collector current vs. Collector-Emitter voltage (typ.) Capacitanse : Cies, Coes, Cres [ nF ] 2 Collector-Emitter voltage : VCE [V] 0 0 50 100 150 200 250 Gate charge : Qg [ nC ] MS6M 0799 a 10 15 H04-004-03a [ Inverter ] [ Inverter ] Switching time vs. Collector current (typ.) Vcc=300V, VGE=±15V, Rg=68ȍ, Tj= 25°C Switching time vs. Collector current (typ.) Vcc=300V, VGE=±15V, Rg=68ȍ, Tj=125°C 1000 Switching time : ton, tr, toff, tf [ nsec ] Switching time : ton, tr, toff, tf [ nsec ] 1000 toff ton tr 100 tf toff ton tr 100 tf 10 10 0 20 40 60 0 80 20 Collector current : Ic [ A ] 80 [ Inverter ] Switching loss vs. Collector current (typ.) Vcc=300V, Ic=50A, VGE=±15V, Tj= 25°C Vcc=300V, VGE=±15V, Rg=68ȍ 4 ton toff 1000 tr 100 tf Switching loss : Eon, Eoff, Err [ mJ/pulse ] Switching time : ton, tr, toff, tf [ nsec ] 60 [ Inverter ] Switching time vs. Gate resistance (typ.) 10000 10 Eon(125°C) Eon(25°C) 3 Eoff(125° 2 Eoff(25°C) 1 Err(125°C) Err(25°C) 0 10 100 1000 0 Gate resistance : Rg [ ȍ ] 20 40 60 80 100 Collector current : Ic [ A ] [ Inverter ] Switching loss vs. Gate resistance (typ.) [ Inverter ] Reverse bias safe operating area (max.) Vcc=300V, Ic=50A, VGE=±15V, Tj= 125°C +VGE=15V,-VGE <= 15V, RG >= 68ȍ ,Tj <= 125°C 120 18 16 Eon 100 14 Collector current : Ic [ A ] Switching loss : Eon, Eoff, Err [ mJ/pulse ] 40 Collector current : Ic [ A ] 12 10 8 6 Eoff 4 80 60 40 20 2 Err 0 0 10 100 Gate resistance : Rg [ ȍ ] 1000 0 200 400 600 800 Collector - Emitter voltage : VCE [ V ] MS6M 0799 a 11 15 H04-004-03a [ Inverter ] Forward current vs. Forward on voltage (typ.) [ Inverter ] Reverse recovery characteristics (typ.) chip Vcc=300V, VGE=±15V, Rg=68ȍ 1000 120 Tj=125°C Reverse recovery current : Irr [ A ] Reverse recovery time : trr [ nsec ] Tj=25°C Forward current : IF [ A ] 100 80 60 40 20 trr (125°C) 100 trr (25°C) Irr (125°C) Irr (25°C) 10 1 0 0.0 0.5 1.0 1.5 2.0 2.5 0 3.0 Forward on voltage : VF [ V ] 20 40 60 80 Forward current : IF [ A ] [ Converter ] / [Anti parallel diode ] Forward current vs. Forward on voltage (typ.) chip 120 Forward current : IF [ A ] 100 80 60 40 Tj=125°C Tj=25°C 20 0 0.0 0.5 1.0 1.5 2.0 Forward on voltage : VFM [ V ] Transient thermal resistance (max.) [ Thermistor ] Temperature characteristics (typ.) 100 FWD[Inverter] IGBT[Brake] 1.000 IGBT[Inverter] Conv.Diode 0.100 0.010 0.001 Resistance : R [ kȍ ] Thermal resistanse : Rth(j-c) [ °C/W ] 10.000 10 1 0.1 0.010 0.100 Pulse width : Pw [ sec ] 1.000 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 Temperature [ °C ] MS6M 0799 a 12 15 H04-004-03a [ Brake ] Collector current vs. Collector-Emitter voltage (typ.) Tj= 25°C / chip [ Brake ] Collector current vs. Collector-Emitter voltage (typ.) Tj= 125°C / chip 50 50 Collector current : Ic [A] 12V VGE=20V 40 Collector current : Ic [A] VGE=20V 15V 40 30 10V 20 15V 12V 30 10V 20 10 10 8V 8V 0 0 0 1 2 3 4 0 5 Collector-Emitter voltage : VCE [V] 3 4 5 [ Brake ] Collector-Emitter voltage vs. Gate-Emitter voltage (typ.) Tj=25°C / chip 50 Collector - Emitter voltage : VCE [ V ] 10 40 30 Tj=25°C Tj=125°C 20 10 8 6 4 Ic=40A Ic=20A Ic=10A 2 0 0 1 2 3 5 4 10 15 20 25 Gate - Emitter voltage : VGE [ V ] Collector-Emitter voltage : VCE [V] [ Brake ] Capacitance vs. Collector-Emitter voltage (typ.) VGE=0V, f= 1MHz, Tj= 25°C [ Brake ] Dynamic Gate charge (typ.) Vcc=300V䋬 Ic=20A䋬Tj= 25°C Collector-Emitter voltage : VCE [ V ] 10.00 Cies 1.00 Coes 0.10 Cres 500 25 400 20 VGE 300 15 200 10 100 5 [V] 0 Gate - Emitter voltage : VGE Collector current : Ic [A] 2 Collector-Emitter voltage : VCE [V] [ Brake ] Collector current vs. Collector-Emitter voltage (typ.) VGE=15V / chip Capacitance : Cies, Coes, Cres [ nF ] 1 VCE 0 0 0.01 0 10 20 Collector-Emitter voltage : VCE [V] 30 0 40 80 120 Gate charge : Qg [ nC ] MS6M 0799 a 13 15 H04-004-03a Warnings - This product shall be used within its absolute maximum rating (voltage, current, and temperature).䇭This product may be broken in case of using beyond the ratings. ຠ䈱⛘ኻᦨᄢቯᩰ䋨㔚䋬㔚ᵹ䋬᷷ᐲ╬䋩䈱▸࿐ౝ䈪ᓮ↪ਅ䈘䈇䇯⛘ኻᦨᄢቯᩰ䉕䈋䈩↪䈜䉎䈫䇮⚛ሶ䈏⎕უ䈜䉎 ႐ว䈏䈅䉍䉁䈜䇯 - Connect adequate fuse or protector of circuit between three-phase line and this product to prevent the equipment from causing secondary destruction, such as fire, its spreading, or explosion. ਁ৻䈱ਇᘦ䈱䈪⚛ሶ䈏⎕უ䈚䈢႐ว䉕⠨ᘦ䈚䇮↪㔚Ḯ䈫ᧄຠ䈱㑆䈮ㆡಾ䈭ኈ㊂䈱䊍䊠䊷䉵䈲䊑䊧䊷䉦䊷䉕ᔅ䈝 ઃ䈔䈩Ἣἴ䋬⊒䋬ᑧ╬䈱䋲ᰴ⎕უ䉕㒐䈇䈪䈒䈣䈘䈇䇯 - Use this product after realizing enough working on environment and considering of product's reliability life. This product may be broken before target life of the system in case of using beyond the product's reliability life. ຠ䈱↪ⅣႺ䉕චಽ䈮ᛠី䈚䇮ຠ䈱ା㗬ᕈኼ䈏ḩ⿷䈪䈐䉎䈎ᬌ⸛䈱䇮ᧄຠ䉕ㆡ↪䈚䈩ਅ䈘䈇䇯ຠ䈱ା㗬ᕈኼ 䉕䈋䈩↪䈚䈢႐ว䇮ⵝ⟎䈱⋡ᮡኼ䉋䉍೨䈮⚛ሶ䈏⎕უ䈜䉎႐ว䈏䈅䉍䉁䈜䇯 - When electric power is connected to equipments, rush current will be flown through rectifying diode to charge 2 DC capacitor. Guaranteed value of the rush current is specified as I t (non-repetitive), however frequent rush current through the diode might make it's power cycle destruction occur because of the repetitive power. In application which has such frequent rush current, well consideration to product life time (i.e. suppressing the rush current) is necessary. 㔚Ḯᛩᤨ䈮ᢛᵹ↪䉻䉟䉥䊷䊄䈮䈲䇮䉮䊮䊂䊮䉰䊷䉕ల㔚䈜䉎ὑ䈱⓭㔚ᵹ䈏ᵹ䉏䉁䈜䇯䈖䈱⓭㔚ᵹ䈮ኻ䈜䉎⸽୯䈲 2 2 I t(㕖➅䈚)䈫䈚䈩⸥䈘䉏䈩䈇䉁䈜䈏䇮䈖䈱⓭㔚ᵹ䈏㗫❥䈮ᵹ䉏䉎䈫I t⎕უ䈫䈲䈮ᢛᵹ↪䉻䉟䉥䊷䊄䈱➅䈚⽶⩄䈮 䉋䉎䊌䊪䊷䉰䉟䉪䊦⠴㊂⎕უ䉕䈖䈜น⢻ᕈ䈏䈅䉍䉁䈜䇯⓭㔚ᵹ䈏㗫❥䈮ᵹ䉏䉎䉋䈉䈭䉝䊒䊥䉬䊷䉲䊢䊮䈪䈲䇮⓭㔚ᵹ୯ 䉕ᛥ䈋䉎䈭䈬䇮ຠኼ䈮චಽ⇐ᗧ䈚䈩䈗↪ਅ䈘䈇䇯 - If the product had been used in the environment with acid, organic matter, and corrosive gas ( hydrogen sulfide, sulfurous acid gas), the product's performance and appearance can not be ensured easily. ㉄䊶ᯏ‛䊶⣣㘩ᕈ䉧䉴䋨⎫ൻ᳓⚛䋬⎫㉄䉧䉴╬䋩䉕䉃ⅣႺਅ䈪↪䈘䉏䈢႐ว䇮ຠᯏ⢻䊶ᄖⷰ╬䈱⸽䈲䈪䈐䉁䈞䉖䇯 - Use this product within the power cycle curve (Technical Rep.No. : MT5F12959). Power cycle capability is classified to delta-Tj mode which is stated as above and delta-Tc mode. Delta-Tc mode is due to rise and down of case temperature (Tc), and depends on cooling design of equipment which use this product. In application which has such frequent rise and down of Tc, well consideration of product life time is necessary. ᧄຠ䈲䇮䊌䊪䊷䉰䉟䉪䊦ኼ䉦䊷䊑એਅ䈪↪ਅ䈘䈇(ᛛⴚ⾗ᢱNo.: MT5F12959)䇯䊌䊪䊷䉰䉟䉪䊦⠴㊂䈮䈲䈖䈱㰱Tj䈮䉋䉎 ႐ว䈱ઁ䈮䇮㰱Tc䈮䉋䉎႐ว䈏䈅䉍䉁䈜䇯䈖䉏䈲䉬䊷䉴᷷ᐲ(Tc)䈱ਅ㒠䈮䉋䉎ᾲ䉴䊃䊧䉴䈪䈅䉍䇮ᧄຠ䉕䈗↪䈜䉎㓙 䈱ᾲ⸳⸘䈮ଐሽ䈚䉁䈜䇯䉬䊷䉴᷷ᐲ䈱ਅ㒠䈏㗫❥䈮䈖䉎႐ว䈲䇮ຠኼ䈮චಽ⇐ᗧ䈚䈩䈗↪ਅ䈘䈇䇯 - Never add mechanical stress to deform the main or control terminal. The deformed terminal may cause poor contact problem. ਥ┵ሶ䈶ᓮ┵ሶ䈮ᔕജ䉕ਈ䈋䈩ᄌᒻ䈘䈞䈭䈇䈪ਅ䈘䈇䇯䇭┵ሶ䈱ᄌᒻ䈮䉋䉍䇮ធ⸅ਇ⦟䈭䈬䉕ᒁ䈐䈖䈜႐ว䈏䈅䉍䉁䈜䇯 - Use this product with keeping the cooling fin's flatness between screw holes within 100um at 100mm and the roughness within 10um. Also keep the tightening torque within the limits of this specification. Too large convex of cooling fin may cause isolation breakdown and this may lead to a critical accident. On the other hand, too large concave of cooling fin makes gap between this product and the fin bigger, then, thermal conductivity will be worse and over heat destruction may occur. ಄ළ䊐䉞䊮䈲䊈䉳ข䉍ઃ䈔⟎㑆䈪ᐔမᐲ䉕100mm䈪100umએਅ䇮㕙䈱☻䈘䈲10umએਅ䈮䈚䈩ਅ䈘䈇䇯䇭ㆊᄢ䈭ಲ䉍 䈏䈅䈦䈢䉍䈜䉎䈫ᧄຠ䈏⛘✼⎕უ䉕䈖䈚䇮㊀ᄢ䈮⊒ዷ䈜䉎႐ว䈏䈅䉍䉁䈜䇯䉁䈢䇮ㆊᄢ䈭ಳ䉍䉇䉉䈏䉂╬䈏䈅䉎䈫䇮 ᧄຠ䈫಄ළ䊐䉟䊮䈱㑆䈮ⓨ㓗䈏↢䈛䈩ᾲ䈏ᖡ䈒䈭䉍䇮ᾲ⎕უ䈮❬䈏䉎䈖䈫䈏䈅䉍䉁䈜䇯 - In case of mounting this product on cooling fin, use thermal compound to secure thermal conductivity. If the thermal compound amount was not enough or its applying method was not suitable, its spreading will not be enough, then, thermal conductivity will be worse and thermal run away destruction may occur. Confirm spreading state of the thermal compound when its applying to this product. (Spreading state of the thermal compound can be confirmed by removing this product after mounting.) ⚛ሶ䉕಄ළ䊐䉞䊮䈮ข䉍ઃ䈔䉎㓙䈮䈲䇮ᾲવዉ䉕⏕䈜䉎䈢䉄䈱䉮䊮䊌䉡䊮䊄╬䉕䈗↪䈒䈣䈘䈇䇯䇮ႣᏓ㊂䈏ਇ⿷䈚䈢䉍䇮 ႣᏓᣇᴺ䈏ਇㆡ䈣䈦䈢䉍䈜䉎䈫䇮䉮䊮䊌䉡䊮䊄䈏චಽ䈮⚛ሶో䈮ᐢ䈏䉌䈝䇮ᾲᖡൻ䈮䉋䉎ᾲ⎕უ䈮❬䈏䉎䈏䈅䉍䉁䈜䇯 䉮䊮䊌䉡䊮䊄䉕ႣᏓ䈜䉎㓙䈮䈲䇮ຠో㕙䈮䉮䊮䊌䉡䊮䊄䈏ᐢ䈏䈦䈩䈇䉎䉕⏕䈚䈩䈒䈣䈘䈇䇯 (ታⵝ䈚䈢ᓟ䈮⚛ሶ䉕ข䉍䈲䈝䈜䈫䉮䊮䊌䉡䊮䊄䈱ᐢ䈏䉍ౕว䉕⏕䈜䉎䈏᧪䉁䈜䇯) - It shall be confirmed that IGBT's operating locus of the turn-off voltage and current are within the RBSOA specification. This product may be broken if the locus is out of the RBSOA. 䉺䊷䊮䉥䊐㔚䊶㔚ᵹ䈱േ゠〔䈏RBSOA᭽ౝ䈮䈅䉎䈖䈫䉕⏕䈚䈩ਅ䈘䈇䇯RBSOA䈱▸࿐䉕䈋䈩↪䈜䉎䈫⚛ሶ䈏⎕უ 䈜䉎น⢻ᕈ䈏䈅䉍䉁䈜䇯 MS6M 0799 a 14 15 H04-004-03a Warnings - If excessive static electricity is applied to the control terminals, the devices may be broken. Implement some countermeasures against static electricity. ᓮ┵ሶ䈮ㆊᄢ䈭㕒㔚᳇䈏ශട䈘䉏䈢႐ว䇮⚛ሶ䈏⎕უ䈜䉎႐ว䈏䈅䉍䉁䈜䇯ข䉍ᛒ䈇ᤨ䈲㕒㔚᳇ኻ╷䉕ታᣉ䈚䈩ਅ䈘䈇䇯 - Never add the excessive mechanical stress to the main or control terminals when the product is applied to equipments. The module structure may be broken. ⚛ሶ䉕ⵝ⟎䈮ታⵝ䈜䉎㓙䈮䇮ਥ┵ሶ䉇ᓮ┵ሶ䈮ㆊᄢ䈭ᔕജ䉕ਈ䈋䈭䈇䈪ਅ䈘䈇䇯┵ሶ᭴ㅧ䈏⎕უ䈜䉎น⢻ᕈ䈏䈅䉍䉁䈜䇯 - In case of insufficient -VGE, erroneous turn-on of IGBT may occur. -VGE shall be set enough value to prevent this malfunction. (Recommended value : -VGE = -15V) ㅒ䊋䉟䉝䉴䉭䊷䊃㔚-VGE䈏ਇ⿷䈚䉁䈜䈫⺋ὐᒐ䉕䈖䈜น⢻ᕈ䈏䈅䉍䉁䈜䇯⺋ὐᒐ䉕䈖䈘䈭䈇ὑ䈮-VGE䈲චಽ䈭୯䈪 ⸳ቯ䈚䈩ਅ䈘䈇䇯䇭䋨ផᅑ୯ : -VGE = -15V) - In case of higher turn-on dv/dt of IGBT, erroneous turn-on of opposite arm IGBT may occur. Use this product in the most suitable drive conditions, such as +VGE, -VGE, RG to prevent the malfunction. 䉺䊷䊮䉥䊮 dv/dt 䈏㜞䈇䈫ኻ᛫䉝䊷䊛䈱䌉䌇䌂䌔䈏⺋ὐᒐ䉕䈖䈜น⢻ᕈ䈏䈅䉍䉁䈜䇯⺋ὐᒐ䉕䈖䈘䈭䈇ὑ䈱ᦨㆡ䈭䊄䊤䉟䊑 ᧦ઙ䋨+VGE, -VGE, RG╬䋩䈪䈗↪ਅ䈘䈇䇯 - This product may be broken by avalanche in case of VCE beyond maximum rating VCES is applied between C-E terminals. Use this product within its absolute maximum voltage. VCES䉕䈋䈢㔚䈏ශട䈘䉏䈢႐ว䇮䉝䊋䊤䊮䉲䉢䉕䈖䈚䈩⚛ሶ⎕უ䈜䉎႐ว䈏䈅䉍䉁䈜䇯VCE䈲ᔅ䈝⛘ኻቯᩰ䈱▸࿐ౝ 䈪䈗↪ਅ䈘䈇䇯 Cautions - Fuji Electric Device Technology is constantly making every endeavor to improve the product quality and reliability. However, semiconductor products may rarely happen to fail or malfunction. To prevent accidents causing injury or death, damage to property like by fire, and other social damage resulted from a failure or malfunction of the Fuji Electric Device Technology semiconductor products, take some measures to keep safety such as redundant design, spread-fire-preventive design, and malfunction-protective design. ን჻㔚ᯏ䊂䊋䉟䉴䊁䉪䊉䊨䉳䊷䈲⛘䈋䈝ຠ䈱ຠ⾰䈫ା㗬ᕈ䈱ะ䈮ദ䉄䈩䈇䉁䈜䇯䈚䈎䈚䇮ඨዉຠ䈲㓚䈏⊒↢䈚䈢䉍䇮 ⺋േ䈜䉎႐ว䈏䈅䉍䉁䈜䇯ን჻㔚ᯏ䊂䊋䉟䉴䊁䉪䊉䊨䉳䊷ඨዉຠ䈱㓚䉁䈢䈲⺋േ䈏䇮⚿ᨐ䈫䈚䈩ੱり䊶Ἣἴ ╬䈮䉋䉎⽷↥䈮ኻ䈜䉎៊ኂ䉇␠ળ⊛䈭៊ኂ䉕䈖䈘䈭䈇䉋䈉䈮౬㐳⸳⸘䊶ᑧ㒐ᱛ⸳⸘䊶⺋േ㒐ᱛ⸳⸘䈭䈬ో⏕ 䈱䈢䉄䈱ᚻᲑ䉕⻠䈛䈩ਅ䈘䈇䇯 - The application examples described in this specification only explain typical ones that used the Fuji Electric Device Technology products. This specification never ensure to enforce the industrial property and other rights, nor license the enforcement rights. ᧄ᭽ᦠ䈮⸥タ䈚䈩䈅䉎ᔕ↪䈲䇮ን჻㔚ᯏ䊂䊋䉟䉴䊁䉪䊉䊨䉳䊷ຠ䉕↪䈚䈢ઍ⊛䈭ᔕ↪䉕⺑䈜䉎䉅䈱䈪䈅䉍䇮 ᧄ᭽ᦠ䈮䉋䈦䈩Ꮏᬺᚲᮭ䇮䈠䈱ઁᮭ䈱ታᣉ䈮ኻ䈜䉎㓚䉁䈢䈲ታᣉᮭ䈱⸵⻌䉕ⴕ䈉䉅䈱䈪䈲䈅䉍䉁䈞䉖䇯 - The product described in this specification is not designed nor made for being applied to the equipment or systems used under life-threatening situations. When you consider applying the product of this specification to particular used, such as vehicle-mounted units, shipboard equipment, aerospace equipment, medical devices, atomic control systems and submarine relaying equipment or systems,䇭please apply after confirmation of this product to be satisfied about system construction and required reliability. ᧄ᭽ᦠ䈮⸥タ䈘䉏䈢ຠ䈲䇮ੱ䈮䈎䈎䉒䉎䉋䈉䈭⁁ᴫਅ䈪↪䈘䉏䉎ᯏེ䈅䉎䈇䈲䉲䉴䊁䊛䈮↪䈇䉌䉏䉎䈖䈫䉕 ⋡⊛䈫䈚䈩⸳⸘䊶ㅧ䈘䉏䈢䉅䈱䈪䈲䈅䉍䉁䈞䉖䇯ᧄ᭽ᦠ䈱ຠ䉕ゞਔᯏེ䇮⦁⥾䇮⥶ⓨቝቮ䇮ක≮ᯏེ䇮ේሶജ ᓮ䇮ᶏᐩਛ⛮ᯏེ䈅䉎䈇䈲䉲䉴䊁䊛䈭䈬䇮․ᱶ↪ㅜ䈻䈱䈗↪䉕䈗ᬌ⸛䈱㓙䈲䇮䉲䉴䊁䊛᭴ᚑ䈶ⷐ᳞ຠ⾰䈮 ḩ⿷䈜䉎䈖䈫䉕䈗⏕䈱䇮䈗↪ਅ䈘䈇䇯 If there is any unclear matter in this specification, please contact Fuji Electric Device Technology Co.,Ltd. MS6M 0799 a 15 15 H04-004-03a
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