低温工学協会 九州・西日本支部研究会 2006 July 20-22 機器応用の ための評価 YBCO線材のMO法による評価 Influence of mechanical cutting PLD/IBAD tape PLD/IBAD tape Photograph of specimen Both sides cut (0.5~0.7mm) 50 mm (length) MO image (30mT, ZFC 40K) 300 µm 30 mT Defects at cut edges 60 mT Defects at cut edges Mechanical cutting process introduces defects ! Superconductivity Research Laboratory (SRL) - ISTEC YBCO線材のMO法による評価 低温工学協会 九州・西日本支部研究会 2006 July 20-22 機器応用の ための評価 Scribing gap ~ 20µm IBAD/PLD tape with laser scribing Ic~250A [SRL] 40 K 65 K 77 K 10 mT 10 mT 10 mT 20 mT 20 mT 20 mT 40 mT 40 mT 40 mT Slitting for reduction of alternating current losses Processing by laser beam There is a few defect introduced by processing in comparison with mechanical processing. Superconductivity Research Laboratory (SRL) - ISTEC YBCO線材のMO法による評価 低温工学協会 九州・西日本支部研究会 2006 July 20-22 機器応用の ための評価 3D image of scribing MO image 77 K Enhanced by focusing effect ZFC 20 mT Superconductivity Research Laboratory (SRL) - ISTEC YBCO線材のMO法による評価 低温工学協会 九州・西日本支部研究会 2006 July 20-22 機器応用の ための評価 IBAD/PLD tape with laser scribing Division into 10 parts 40 K 40 mT A few defects were occurred. 40 K 80 mT 10 mm Superconductivity Research Laboratory (SRL) - ISTEC 低温工学協会 九州・西日本支部研究会 2006 July 20-22 機器応用の ための評価 YBCO線材のMO法による評価 40 K 80 mT 10 mm Superconductivity Research Laboratory (SRL) - ISTEC YBCO線材のMO法による評価 低温工学協会 九州・西日本支部研究会 2006 July 20-22 機器応用の ための評価 MOI on over current samples Over current experiments carried out in Waseda Univ. Prof. Ishiyama. Two kinds of defects were observed Over current （＜600 K) PLD Ag10µm 150 mm Defect of the whole spreading MOCVD (Chubu Electric) Defect through the length direction Superconductivity Research Laboratory (SRL) - ISTEC YBCO線材のMO法による評価 低温工学協会 九州・西日本支部研究会 2006 July 20-22 機器応用の ための評価 Correspondence of MO images with fine texture What is happen at the defects area detected by MOI ? The over current （>600 K) applied to clarify what is changed. V12 V23 V34 V45 V56 V67 V78 5 mT 10 mT Superconductivity Research Laboratory (SRL) - ISTEC
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