An Invitation Nano-Mechanical Testing and Surface Imaging for Nano & Bio Materials Characterization Advanced Techniques : AFM / STM, FESEM / EDX, NanoIndenter and Nano UTM Date: 30th October 2014 (Thursday) Venue: ITS Office, Shah Alam Time: 8:30am – 4:30pm Highlights of unique features offered by Keysight Nano-Measurement Technologies (formerly known as Agilent Technologies). • Achieving atomic resolution by single 90um closed loop scanner with AFM • Express Test for nano-mechanical testing with Nano-indenter – one full cycle of measurement per second • Low voltage high resolution imaging and composition analysis without sample coating with Bench Top Field Emission SEM and EDS • Highest sensitivity for tensile test of nano and micro scale single fibers with Nano UTM We are pleased to invite you to our seminar to find out more about our new offerings! REGISTRATION FORM To register, please complete the reply portion below: Name (Mr / Ms / Mrs / Dr / Prof.) : ............................................................................................................... Company / Dept : ....................................................................................................................................... Tel : ........................................................................ Fax : ........................................................................ Address : .................................................................................................................................................. ................................................................................................................................................................... Email : ....................................................................................................................................................... Mobile No. : ............................................................................................................................................... Sorry, I cannot join you but I would like to receive product information Please Note: • All interested participants should fax or e-mail their particulars to register with ITS by 23rd October 2014 • Seats are available only on a first-come-first-serve basis. Please register early to avoid disappointment. • A gentle reminder for all registered participants: be punctual For information and registration, please contact Mr. Wilson Wong Mobile No. : 019 - 218 2864 Tel : 03 - 5740 9888 (ext. 229) Email : [email protected] Ms. Nurul Tel : 03 - 5740 9888 (ext. 238) Fax : 03 - 5740 9866 Email : [email protected] formerly known as Agilent Technologies AGENDA 08:30am 09:00am 09:15am 09:30am 10:30am 10:45am 11:30pm ........ ........ ........ ........ ........ ........ ........ 01:00pm ........ 02:00pm ........ 03:15am ........ 03.30pm ........ 04:30pm ........ Registration & Welcome Coffee Welcome Note ...................................................................................... Introduction of Keysight Technologies .................................................. Advance Applications of AFM ............................................................... Tea Break Multi-disciplinary Research with the New 7500 Series AFM ................ The Latest Development and Application of the New Compact FESEM with EDS .................................................................. Lunch Quasi-static and Dynamic Properties of Single Nano and Micro Fibers .......................................................................................... Tea Break In-Situ Nanomechanical Test Technologies .......................................... Q&A session Ms. Pung Chai Chin Dr. Xiu-Qiang Tong Dr. Xiu-Qiang Tong Dr. Xiu-Qiang Tong Dr Jianfeng Chen Dr. Cunyi Xie Dr. Cunyi Xie SPEAKER PROFILE Dr. Xiu-Qiang Tong Specialist in AFM Dr. Xiu Qiang Tong is now the Sales Manager for China, Singapore and Malaysia at Nano Scale Sciences Division of Keysight Technologies (previously known as Agilent Technologies, Inc.). Before this he had been an Application Scientist of Molecular Imaging Co. and an Application Manager of Agilent Nano-measurement Division for providing worldwide technical and application support. Before joining Molecular Imaging, he had been in 3 postdoctoral positions in Glasgow, Birmingham and Southampton universities in the United Kingdom, carrying out research projects in the electrochemistry and SPM related fields. He completed studies in Metallurgy and Materials (B. Eng. & M. Eng.) at Tsinghua University, China, before moving to Queen’s University, UK, where he earned his PhD in Physical Chemistry. He has published over 30 scientific papers in international journals. Dr. Cun-Yi Xie Specialist in Nano-Indentation 2000-Present: Application Engineer of Keysight (Agilent, MTS) 1997-2000 : Research Associate, The University of Sheffield, UK. 1995-1997 : Ph.D student/TA，Swiss Federal Institute of Technology - Lausanne (EPFL) 1983-1995 : Associate professor, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei, China 1983 : Graduated in Nanjing University, China His research fields cover mechanical properties and microstructure study on high damping materials, high Tc superconductors, nano-structured material. Main Focus on the nano-mechanical test technology and its application in material sciences. He has more than thirty publications such as “Journal of Applied Physic” & “Mater. Sci. & Eng. A”etc. Dr. Jianfeng Chen Keysight Specialist in SEM & FIB 2014-Present: Keysight Technologies Application Engineer for FESEM, China 2011-2014 : Agilent Technologies Application Engineer for FESEM, Singapore 2003-2011 : FEI Application Engineer of SEM and FIB, China 2003 : Ph.D on Polymer Physics, Changchun Institute of Applied Chemistry, CAS, China, with research on high resolution microscopy of polymer crystalline. formerly known as Agilent Technologies The new Agilent 7500 AFM enables scientists to image nanoscale structure and to characterize electrical, magnetic and mechanical properties of materials such as metals, ceramics, polymers and semiconductors. It also allows scientists to explore dynamic properties of biological systems by imaging patterns of molecular events. Various modes of imaging and force spectroscopy have been developed to correlate structure, properties, and chemical interactions of molecules in various environments. Here we show examples of nanoscale studies with the 7500 AFM on materials ranging from metals, semiconductors, polymers to biological cells and single molecules with various modes and methods including but not limited to conductivity, electrochemistry, lithography, magnetic force, surface potential, single molecule spectroscopy, elastic modulus mapping, dynamic lateral force and humidity control. In the course of 60 years’ development of the scanning electron microscopy scientists have paid much of their attention on making the electron microscopes with shorter-wave-length electron sources to achieve better resolution by means of higher accelerating voltage. The biggest electron microscope column with a 3, 000, 000eV built in 1950s was a milestone of these efforts, although the resolution of which is not as good as a 200keV microscope today. Not until recently Dr. Lawrence Murray has showed us another breakthrough in this field: an incredibly small 9mm electron microscope column, together with world’s only compact field emission scanning electron microscope. The introduction of a built-in all static electric field lense, together with its wafer level integrated design and manufacturing technologies, has greatly improved the stability and reliability of the electron microscope column comparing with those produced by traditional manual technologies. This also gives us the feasibility of the electron column array applications. At the same time, the nature of the electrostatic lens itself makes the imaging performance on magnetic specimens much better and easier than the traditional systems with electromagnetic lens electron optics. Together with the high brightness and low energy spread Schottky field emission electron source, the compact electron optical system can easily achieve less than 10nm point resolution at 1keV accelerating voltage, which is suitable for high resolution imaging of various materials surfaces, especially the non-conductive or electron beam irradiation sensitive surfaces. Equipped with the EDS attachment, the compact FESEM can meet most of the requirements in the electron microscopic research today. Here we give a brief introduction of the Keysight FESEM 8500B, with its unique low voltage high resolution imaging features and the latest application results obtained on different kinds of specimens. formerly known as Agilent Technologies Natural and synthetic fibers are used in many products including fabric, insulation, and composite materials. Often, the mechanical properties of the fibers dictate the performance and longevity of the products in which they are used. Generally, it is not sufficient to assume that a fiber will have the same strength as a larger specimen of the same material. This is especially true for metals, because strength depends directly on grain size, and grain size depends on geometric constraints. So for its size, a thin metal wire will generally be stronger than a large specimen of the same material, because the wire has smaller grains. Some polymers also manifest size-dependent strengthening mechanisms. Therefore, the ability to measure the mechanical properties of very fine single fibers is essential for their successful incorporation into products. In-situ nanomechanical testing is a very useful technology in many fields of material sciences & engineering. This includes composite material, multiphase material as well as MEMS device. It can allow us to use a same diamond tip to make indentation for measuring mechanical properties and 3D image scan. With the Keysight patented Continuous Stiffness Measurement (CSM) technology, we can measure substrate independent hardness and Young’s modulus of thin films. With the Keysight developed Express Test technology, we can run 40X40 indent array within 26mins. Each indent is only taken less than 1 second in average. This technology can allow us easily to make mechanical mapping (hardness mapping and modulus mapping). Other techniques and methods by the instrumented indentation testing for many applications will also be presented. formerly known as Agilent Technologies LOCATION MAP formerly known as Agilent Technologies
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