ICP OPTICAL EMISSION SPECTROSCOPY TECHNICAL NOTE 24 ICP Spectrometer Selection Criteria: ACTIVA and ULTIMA 2 HORIBA Jobin Yvon SAS, Longjumeau, France For internal use only Concept Simultaneous analysis through a moving window of analysis called the Wavelength Analytical View (WAV) Sequential analysis through the use of a moving grating and a fixed, single channel PMT detector. Optical Dispersive System The dispersive system of the ACTIVA is based on a 0.64m Czerny-Turner optical mount, with an innovative photon collector device, the Achromatic Entrance Imager. Tthe exit slit is eliminated and the single channel PMT detector is replaced by a multi-channel CCD detector. A several nm-large spectral window (WAV) is then measured, which provides an abundance of spectral line and background information. A powerful, dedicated preshot function allows the CCD detector to acquire truly simultaneous measurements of a large number of line (and background) intensities across the WAV. Selection of a spectral window is performed according to its analytical interest, i.e. number of elements and/or number of lines per element. Access to other regions of interest is obtained by window jumping. The dispersive system of the ULTIMA 2 is based on the use of a 1.0 m Czerny-Turner monochromator. Wavelength selection is performed through rotation of a plane grating. Selection of the spectral bandpass is obtained by using narrow entrance and exit slits, usually in the range 10-50 ?m. Measurement of intensities at different wavelength locations is inherently in a sequential way. As a consequence of the use of multi-channel CCD detection, more information is obtained in contrast to a monochromator, where only a single line and its vicinity are examined. Acquisition of large spectrum portions or even entire UV-visible spectra is, then, possible. An ACTIVA ICP-based spectra data base is available, and through ACTIVAnalyst software tools, semi quantitative analysis/fingerprint and multi-line quantitative analysis may be conducted. Photon detection is conducted with a single channel, photomultiplier tube (PMT). The ULTIMA 2 results from a long development within HJY and has achieved a high maturity in terms of analytical performance and software. The PMT remains an unsurpassable detector in terms of wavelength range, low noise, and inherent adjustable gain. A PMT is easy to set-up and does not require any cooling system. Detection System Because the dispersive system works in a sequential way, optimization of the operating parameters, power, carrier gas flow rate and integration time can be obtained for a given element or group of elements. The ULTIMA 2 is then highly suitable for the determination of minor and trace elements in complex matrices, in particular with linerich matrices. The ULTIMA 2 can be then selected not only by laboratories with various and difficult analytical problems, but also by research laboratories. ICP OPTICAL EMISSION SPECTROSCOPY TECHNICAL NOTE 24 Performance Limits of detection are excellent, including those for lines below 190 nm, and comparable to the competition. Total Plasma View is achieved by the imaging of the entire height of the central plasma channel onto the full height of the detector. Although slightly degraded compared to the ULTIMA 2, the 9-pm resolution is constant up to 440 nm and again is comparable to all solid state detector based ICP spectrometers available today. The ULTIMA 2 exhibits the highest possible resolution in the range 165-300 nm, i.e. less than 5 pm. This results from the 1-m focal length associated with a 2400 lines/mm holographic grating working in the 1st and 2nd order, and with narrow entrance and exit slits. This high practical resolution makes it possible to determine trace elements in line-rich matrices (W, Co, Fe, REE...) without loss in sensitivity. Besides, such a high resolution provides a high signal-to-background ratio, by minimizing the contribution of the background below the line profile, thus providing the ultimate limits of detection of the HJY ICP systems. These excellent limits of detection are obtained by using the radial viewing mode, and compete well with those obtained by other manufacturers using the axial viewing mode. Limitations Use of a CDD detector implies a camera and associated fast electronics, along with a cooling system, which is more complex and costly than the set-up of a PMT. Although slightly degraded compared to the ULTIMA 2, the 9-pm resolution is constant up to 440 nm. The only ULTIMA 2 limitation is inherent to its sequential principle. Usually, a single line per element is selected, and there is a need to scan the line profile and the adjacent background to deduce the net line intensity. Consequently, the determination of a large number of elements per sample may be time consuming. Main Features • Full benefit of the available UV-visible information o Availability of a comprehensive spectra data base o Dedicated software tools for efficient semi quantitative and multi-line analysis • Best possible practical resolution • Best limits of detection • Full flexibility in optimization • Highly suitable for complex matrices • Simultaneous measurements of line and background intensities within a spectral window • Excellent and competitive LODs • Full benefit of radial viewing through total plasma imaging • Highly suitable for productive routine analysis 2 ICP OPTICAL EMISSION SPECTROSCOPY TECHNICAL NOTE 24 The ACTIVA is dedicated to productive routine Key Applications work for a large number of samples and ele- The ULTIMA 2 is dedicated to any application requiring the lowest possible detection limits and/or the best optical resolution, i.e. in difficult, line rich matrices. Markets ments. Because of the use of multi-line analysis, reliability of concentration measurements is improved as it is possible to diagnose matrix spectral and non-spectral interferences. • Environmental • Precious Metals • Production • Rare Earths (REE) • Commercial Labs • Nuclear • Oil Analysis • Metals & Mining • WEEE/RoHS Compliance • Semiconductor • QA/QC • Materials Science • Utilities • Research & Development • Any application requiring speed • Academic • Any application requiring the highest optical resolution In the USA: HORIBA Jobin Yvon Inc. 3880 Park Avenue Edison, NJ 08820 Tel: 1-732-494-8660 Fax: 1-732-494-8796 E-mail: [email protected] 1-866-JobinYvon www.jobinyvon.com In France: HORIBA Jobin Yvon S.A.S. 16-18, rue du Canal 91165 Longjumeau Cedex Tel: (33) 1/64 54 13 00 Fax: (33) 1/69 09 90 88 In Japan: Horiba Ltd. 2 Miyanohigashi, Kisshoin Minami-ku, Kyoto 601-8510 TEL: (81) 75 313 8121 FAX: (81) 75 321 5725 www.horiba.com Germany: (49) 89/46 23 17-0 Italy: (39) 2/57 60 56 90 U.K.: (44) 20/82 04 81 42 China: (86) 10/6836 6542 Spain: (34) 91/724 16 57 Other Countries: Contact JY S.A.S. 3
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