Deutsche Akkreditierungsstelle GmbH
Annex to the Accreditation Certificate D-PL-17667-01-00
according to DIN EN ISO/IEC 17025:2005
Period of validity: 2014-03-26 to 2019-03-25
Date of issue: 2014-03-26
Holder of certificate:
Deutscher Sparkassen Verlag GmbH
EMVCo- und DK-Prüflabor
Am Wallgraben 115, 70565 Stuttgart
Tests in the fields:
Functional tests of smart cards based on operating system SECCOS
Standard /
in house procedure /
Version
Specification
Version 6.1.1 of
11/11/2009;
Title of standard or in house procedure
(Deviations / Modifications of standard)
Test area /
Reductions
Interface Specifications for the SECCOS ICC, Functional tests of smart cards
/ DK Testsuite 1
Secure Chip Card Operating System (SECCOS)
Version 6.2.1 of
11/11/2009;
Version 6.3 of
22/03/2011;
Errata of
09/12/2011;
Addendum V1.0.1
of 03/04/2013;
Specification
Version 1.0 of
01/12/1999
Specification
Version 1.1 of
11/11/2009
Schnittstellenspezifikation für die ZKA-Chipkarte, Functional tests of smart cards
Datenstrukturen und Kommandos Nachladen / DK Testsuite 1
von Programmcode
Interface specifications for the SECCOS ICC, EMV Functional tests of smart cards
/ DK Testsuite 1
Commands and SECCOS EMV Applications
This document is a translation. The definitive version is the original German annex to the accreditation certificate.
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Annex to the accreditation certificate D-PL-17667-01-00
Standard /
in house procedure /
Version
Specification
Version 1.0.1 of
29/12/2009
Specification
Draft Version 1.0 of
06/11/2013
Specification
Version 1.0 of
17/09/2007
Specification
Version 1.0 of
09/10/2006;
Version 1.3 of
21/03/2011
Specification
Version 1.0 of
08/10/2010
Specification
Version 1.0 of
08/10/2010
Specification
Version 1.0 of
08/10/2010
Specification
Version 1.0 of
08/10/2010
Specification
Version 1.0.1 of
18/07/2011
Test plan
Version 4.3.a
November 2012
Test plan
Version 1.5 of
05/02/2013
Test plan
Version 4.3.b
November 2013
Test plan
Version 1.0.i
October 2013
Title of standard or in house procedure
(Deviations / Modifications of standard)
Test area /
Reductions
Interface specifications for the SECCOS ICC, EMV Functional tests of smart cards
Commands and SECCOS EMV Applications / DK Testsuite 1
Extension for PayPass
Interface Specifications for the SECCOS ICC, EMV Functional tests of smart cards
Commands and SECCOS EMV Applications, New / DK Testsuite 1
Functionality for Contactless
Interface Specifications for the SECCOS ICC, Functional tests of smart cards
/ DK Testsuite 1
electronic cash Commands and electronic cash
Application (for SECCOS)
Schnittstellenspezifikation für die ZKA-Chipkarte, Functional tests of smart cards
GeldKarte Applikation elektronische Geldbörse / DK Testsuite 1
für SECCOS
Schnittstellenspezifikation für die ZKA-Chipkarte, Functional tests of smart cards
/ DK Testsuite 1
Dateien des MF für SECCOS Sicherheitsmodule
Schnittstellenspezifikation für die ZKA-Chipkarte, Functional tests of smart cards
GeldKarte, SECCOS – Händlerkarte
/ DK Testsuite 1
Schnittstellenspezifikation für die ZKA-Chipkarte,
Zusatzanwendungen, Vorstrukturierung SECCOS Sicherheitsmodule
Schnittstellenspezifikation für die ZKA-Chipkarte,
Zusatzanwendungen, SECCOS - Sicherheitsmodul
Fahrschein
Schnittstellenspezifikation für die ZKA-Chipkarte,
Zusatzanwendungen, SECCOS - Sicherheitsmodul
Marktplatz
EMVCo Card Type Approval - Card Level 1
Electrical and Protocol - Test Cases
Functional tests of smart cards
/ DK Testsuite 1
Functional tests of smart cards
/ DK Testsuite 1
Functional tests of smart cards
/ DK Testsuite 1
Functional tests of smart cards
/ EMVCo Level 1 -contact
Scope for the Testing EMVCo Card Level 1 of Functional tests of smart cards
/ EMVCo Level 1 - contact
SECCOS Cards
EMVCo Card Type Approval - CCD Level 2 – Test Functional tests of smart cards
/ EMVCo Level 2 - contact
Cases
EMVCo Card Type Approval - CPA Level 2 – Test Functional tests of smart cards
/ EMVCo Level 2 - contact
Cases
Period of validity: 2014-03-26 to 2019-03-25
Date of issue: 2014-03-26
- Translation -
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Annex to the accreditation certificate D-PL-17667-01-00
Standard /
in house procedure /
Version
Test plan
Version 1.0.i.1 of
17/10/2013
Test plan
Third Edition
01/12/2012
Test plan
Fifth Edition
19/08/2013
Test plan
Version 4.3.a
September 2012
Title of standard or in house procedure
(Deviations / Modifications of standard)
Test area /
Reductions
Scope for the Testing EMVCo Card Level 2 of Functional tests of smart cards
SECCOS Cards
/ EMVCo Level 2 - contact
CAWG Bulletin No. 13 CCD Regression Testing
Functional tests of smart cards
/ EMVCo Level 2 - contact
CAWG Bulletin No. 14 CPA Regression Testing
Functional tests of smart cards
/ EMVCo Level 2 - contact
EMVCo Card Type Approval CCD Level 1 and Functional tests of smart cards
/ EMVCo Level 1 - contact
Level 2 Card Images Requirements
Version 4.3.b
November 2013
Functional tests of smart cards
/ EMVCo Level 2 - contact
Test plan
Version 1.0.h
September 2012
EMVCo Card Type Approval CPA Level 1 and Functional tests of smart cards
/ EMVCo Level 1 - contact
Level 2 Card Images Requirements
Version 1.0.i
November 2013
Functional tests of smart cards
/ EMVCo Level 2 - contact
Test plan
Version 2.3.1.a
November 2013
Test plan
Version 2.3.1.a
November 2013
Test plan
Version 1.1 of
14/03/2014
EMV Contactless Specifications for Payment
Systems, EMVCo Contactless Type Approval: PICC
Analogue Test Bench and Test Case
Requirements
EMVCo PICC Level 1 Protocol Digital Test Cases
Functional tests of smart cards
/ EMVCo Level 1 Analoguecontactless
Scope for the Testing EMVCo PICC Level 1
Analogue and Digital of SECCOS Cards
Functional tests of smart cards
/ EMVCo Level 1 Analoguecontactless and EMVCo Level 1
Digital- contactless
Period of validity: 2014-03-26 to 2019-03-25
Date of issue: 2014-03-26
- Translation -
Functional tests of smart cards
/ EMVCo Level 1 Digitalcontactless
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